Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Naji, M.
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Jensen, J.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2016Pattern-induced magnetic anisotropy in FePt thin films by ion irradiation28citations
  • 2015Control of Ti 1− x Si x N nanostructure via tunable metal-ion momentum transfer during HIPIMS/DCMS co-deposition59citations
  • 2014Effect of WN content on toughness enhancement in V1−xWxN/MgO(001) thin films51citations
  • 2013Epitaxial V0.6W0.4N/MgO(001): Evidence for ordering on the cation sublattice18citations
  • 2013Toughness enhancement in hard ceramic thin films by alloy design127citations
  • 2007FePt thin film irradiated with high energy ions9citations

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Chart of shared publication
Mccord, J.
1 / 7 shared
Schafer, R.
1 / 1 shared
Jaafar Ruiz-Castellanos, Miriam
1 / 3 shared
Sanz, R.
2 / 5 shared
Vázquez, M.
2 / 9 shared
Asenjo, A.
2 / 4 shared
Patscheider, J.
1 / 24 shared
Greczynski, G.
1 / 5 shared
Alling, B.
1 / 2 shared
Hultman, L.
4 / 17 shared
Lu, J.
4 / 19 shared
Petrov, I.
4 / 13 shared
Ektarawong, A.
1 / 2 shared
Greene, J. E.
4 / 15 shared
Kindlund, Hanna
3 / 10 shared
Sangiovanni, D. G.
2 / 3 shared
Chirita, V.
2 / 2 shared
Birch, J.
1 / 6 shared
Martínez-De-Olcoz, L.
1 / 1 shared
Mccord, Jeffrey
1 / 40 shared
Hjort, K.
1 / 1 shared
Schäfer, R.
1 / 19 shared
Flohrer, S.
1 / 1 shared
Jaafar, M.
1 / 5 shared
Chart of publication period
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2015
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Co-Authors (by relevance)

  • Mccord, J.
  • Schafer, R.
  • Jaafar Ruiz-Castellanos, Miriam
  • Sanz, R.
  • Vázquez, M.
  • Asenjo, A.
  • Patscheider, J.
  • Greczynski, G.
  • Alling, B.
  • Hultman, L.
  • Lu, J.
  • Petrov, I.
  • Ektarawong, A.
  • Greene, J. E.
  • Kindlund, Hanna
  • Sangiovanni, D. G.
  • Chirita, V.
  • Birch, J.
  • Martínez-De-Olcoz, L.
  • Mccord, Jeffrey
  • Hjort, K.
  • Schäfer, R.
  • Flohrer, S.
  • Jaafar, M.
OrganizationsLocationPeople

article

Epitaxial V0.6W0.4N/MgO(001): Evidence for ordering on the cation sublattice

  • Kindlund, Hanna
  • Hultman, L.
  • Lu, J.
  • Petrov, I.
  • Greene, J. E.
  • Jensen, J.
Abstract

<jats:p>V0.6W0.4N alloys are grown on MgO(001) by ultrahigh vacuum reactive magnetron sputtering from V and W targets in 10 mTorr pure-N2 atmospheres at temperatures Ts ranging from 600 to 900 °C. Based on x-ray diffraction and transmission electron microscopy results, all films have the B1-NaCl crystal structure and grow with a cube-on-cube epitaxial relationship to the substrate, (001)VWN‖(001)MgO and [100]VWN‖[100]MgO. Rutherford backscattering spectrometry analyses show that the N content in V0.6W0.4Nx alloys decreases with increasing Ts from overstoichiometric with x = 1.13 at 600 °C, to approximately stoichiometric with x = 1.08 at 700 °C, to understoichiometric at 800 °C (x = 0.80) and 900 °C (x = 0.75). High-resolution scanning transmission electron microscopy, Z-contrast, and selected-area electron diffraction investigations of V0.6W0.4N(001) alloys grown at 600 and 700 °C reveal the onset of W ordering on adjacent 111 planes of the metal sublattice; no ordering is observed for understoichiometric films grown at higher temperatures.</jats:p>

Topics
  • impedance spectroscopy
  • x-ray diffraction
  • electron diffraction
  • reactive
  • transmission electron microscopy
  • spectrometry
  • Rutherford backscattering spectrometry