Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Elwenspoek, M. C.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2007Spreading of thin-film metal patterns deposited on nonplanar surfaces using a shadow mask micromachined in si (110)17citations
  • 2006A novel surface micromachining process to fabricate AlN unimorph suspensions and its application for RF resonators29citations
  • 2005Micromachined fountain pen as a tool for atomic force microscope-based nanoelectrochemical metal deposition6citations
  • 2002Micromachined Palladium - Silver Alloy Membranes for Hydrogen Separationcitations
  • 2001Platinum patterning by a modified lift-off technique and its application in a silicon load cellcitations
  • 2000Characterization of platinum lift off techniquecitations

Places of action

Chart of shared publication
Gardeniers, Han
2 / 26 shared
Dorsman, R.
1 / 1 shared
Berenschot, Erwin J. W.
6 / 36 shared
Kleijn, C. R.
1 / 3 shared
Tiggelaar, R. M.
1 / 3 shared
Saravanan, S.
1 / 10 shared
Krijnen, Gijs J. M.
4 / 14 shared
Deladi, S.
1 / 2 shared
Tas, N. R.
1 / 1 shared
Boer, M. J. De
2 / 2 shared
Jansen, H. V.
1 / 1 shared
Van Rijn, Cees
1 / 5 shared
Hien, Tong Duy
3 / 4 shared
Gielens, F. C.
1 / 2 shared
Nijdam, W.
1 / 4 shared
Wiegerink, Remco
2 / 8 shared
Zwijze, R. A. F.
2 / 2 shared
Chart of publication period
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Co-Authors (by relevance)

  • Gardeniers, Han
  • Dorsman, R.
  • Berenschot, Erwin J. W.
  • Kleijn, C. R.
  • Tiggelaar, R. M.
  • Saravanan, S.
  • Krijnen, Gijs J. M.
  • Deladi, S.
  • Tas, N. R.
  • Boer, M. J. De
  • Jansen, H. V.
  • Van Rijn, Cees
  • Hien, Tong Duy
  • Gielens, F. C.
  • Nijdam, W.
  • Wiegerink, Remco
  • Zwijze, R. A. F.
OrganizationsLocationPeople

article

Spreading of thin-film metal patterns deposited on nonplanar surfaces using a shadow mask micromachined in si (110)

  • Elwenspoek, M. C.
  • Gardeniers, Han
  • Dorsman, R.
  • Berenschot, Erwin J. W.
  • Kleijn, C. R.
  • Tiggelaar, R. M.
Abstract

The application of a three dimensional, self-aligning shadow mask in (110)-oriented silicon for thin-film metal deposition is discussed. This shadow mask is used for the deposition of metal tracks on the bottom of structures with vertical sidewalls, i.e., the patterning of metal catalytic patches underneath the membrane that covers the deep flow channel of a high-temperature gas microreactor. The accuracy of this patch definition—pattern spreading—is investigated for rhodium and platinum as a function of the mask-to-substrate distance. The pattern of sputter-deposited patches is subject to pattern spreading when the gap between the shadow mask and the substrate is nonzero. The experimental patch widening shows a square root dependency on the gap size. Via numerical simulations of molecular gas flows using a direct simulation Monte Carlo method, it is shown that there is excellent agreement between the observed experimental data and this model taking into account values for the sticking () and accommodation () coefficients of the atoms on the walls of the shadow mask below unity (i.e., =0.5 and =0.1), and a baseline shift due to curvature and/or bending of the shadow mask and/or substrate.

Topics
  • Deposition
  • impedance spectroscopy
  • surface
  • simulation
  • Rhodium
  • Platinum
  • Silicon
  • Monte Carlo method