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Azevedo, Nuno Monteiro |
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Ahmad, Bilal
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Publications (5/5 displayed)
- 2024Feasibility study of friction stir joining of aluminium with carbon fibre reinforced thermoplastic composite
- 2023Residual Stresses in Alloy IN718 Produced Through Modulated Laser Powder Bed Fusioncitations
- 2021Effects of process variants on residual stresses in wire arc additive manufacturing of aluminium alloy 5183citations
- 2021Crash simulation of woven fabric thermoplastic composites ; Crash-Simulation von gewebten thermoplastischen Faserverbundwerkstoffen
- 2019An experimental study of residual stress and direction-dependence of fatigue crack growth behaviour in as-built and stress-relieved selective-laser-melted Ti6Al4Vcitations
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article
Effects of process variants on residual stresses in wire arc additive manufacturing of aluminium alloy 5183
Abstract
<jats:title>Abstract</jats:title><jats:p>Development of residual stress of high magnitude, to the extent of material yield strength and in some cases higher than yield strength, is one of the major challenges faced by components produced using wire arc additive manufacturing (WAAM). This study focuses on aluminium alloy 5183 with respect to the residual stress formation and distribution in WAAM builds. Residual stresses were determined using the contour method. The effects of processing conditions, such as substrate thickness, interlayer temperature and deposit height on the magnitude and distribution of residual stresses were investigated. Substrate thickness was found to have a major influence on the residual stress distribution along the sample height. Tensile residual stress up to the value of the material yield strength was present. Majority part of deposit showed tensile stress while substrate showed compensating compressive residual stress. Lower interlayer temperature samples exhibited residual stresses of higher degree of magnitude compared sample produced using higher interlayer temperature. Deposit height i.e. total number of layers affected stress distribution pattern similar to substrate thickness.</jats:p>