Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2025Towards strain gauge 2.0: Substituting the electric resistance routinely deposited on polyimide film by the optimal pattern for full-field strain measurement1citations
  • 2024Towards strain gauge 2.0: Substituting the electric resistance routinely deposited on polyimide film by the optimal pattern for full‐field strain measurement1citations
  • 2021Metrological assessment of multi‐sensor camera technology for spatially‐resolved ultra‐high‐speed imaging of transient high strain‐rate deformation processes8citations

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Chart of shared publication
Grédiac, Michel
1 / 3 shared
Blaysat, Benoît
1 / 4 shared
Sur, Frédéric
2 / 4 shared
Balandraud, Xavier
2 / 23 shared
Jailin, Thomas
2 / 6 shared
Blaysat, Benoit
1 / 1 shared
Grediac, Michel
1 / 5 shared
Berthe, Julien
1 / 18 shared
Portemont, Gérald
1 / 13 shared
Réthoré, Julien
1 / 56 shared
Seghir, Rian
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2025
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2021

Co-Authors (by relevance)

  • Grédiac, Michel
  • Blaysat, Benoît
  • Sur, Frédéric
  • Balandraud, Xavier
  • Jailin, Thomas
  • Blaysat, Benoit
  • Grediac, Michel
  • Berthe, Julien
  • Portemont, Gérald
  • Réthoré, Julien
  • Seghir, Rian
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article

Towards strain gauge 2.0: Substituting the electric resistance routinely deposited on polyimide film by the optimal pattern for full‐field strain measurement

  • Vinel, Adrien
  • Blaysat, Benoit
  • Sur, Frédéric
  • Balandraud, Xavier
  • Grediac, Michel
  • Jailin, Thomas
Abstract

<jats:title>Abstract</jats:title><jats:p>The checkerboard constitutes the best pattern for full‐field strain measurement because it maximizes image gradient. In the experimental mechanics community, employing this pattern is currently strongly limited because depositing it on the surface of specimens raises practical difficulties. A recent study shows, however, that it is technically possible by using a laser engraver. The present paper aims to push this solution forward by printing a checkerboard pattern on a thin polymeric film and then gluing the resulting laser‐engraved film on the specimen surface. The underlying idea is to separate the manufacturing process of this optical strain gauge on the one hand and its use on the other hand to help spread this strain measuring tool in the experimental mechanics community. The polymeric film employed here is the same as that used in the manufacturing process of classic electrical gauges, so one can rely on the know‐how of classic strain gauge bonding to glue this optical strain gauge on the specimen surface. The main difference between the proposed tool and classic electrical gauges is that the strain field beneath the polymeric support is measured instead of localized strain values. The paper is a proof of concept for this strain field measuring tool. The manufacturing and bonding processes are described in the paper. The localized spectrum analysis, a spectral technique developed for processing images of periodic patterns, is used to retrieve the strain fields from checkerboard images. Through two complementary examples, we show the ability of this new type of strain gauge to detect and quantify local details in the strain field beneath. A simplified 1D model is also proposed to assess the minimum width of the strain peak that can reliably be measured with this technique.</jats:p>

Topics
  • impedance spectroscopy
  • surface