| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Stöger-Pollach, Michael
TU Wien
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (6/6 displayed)
- 2023Tl(I) sequestration by pharmacosiderite supergroup arsenatescitations
- 2023L-Ascorbic Acid Treatment of Electrochemical Graphene Nanosheets: Reduction Optimization and Application for De-Icing, Water Uptake Prevention, and Corrosion Resistancecitations
- 2023Partial Oxidation of Bio-methane over Nickel Supported on MgO–ZrO2 Solid Solutionscitations
- 2023Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscopecitations
- 2019Structure and properties of Ta/Al/Ta and Ti/Al/Ti/Au multilayer metal stacks formed as ohmic contacts on n-GaNcitations
- 2018Visualizing catalyst heterogeneity by a multifrequential oscillating reactioncitations
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article
Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscope
Abstract
<jats:title>Abstract</jats:title><jats:p>Since semiconductor structures are becoming smaller and smaller, the examination methods must also take this development into account. Optical methods have long reached their limits here, but small dimensions are also a challenge for electron beam techniques, especially when it comes to determining optical properties. In this paper, electron microscopic methods of investigating optical properties are discussed. Special attention is given to the physical limits and how to deal with them. We will cover electron energy loss spectrometry as well as cathodoluminescence spectrometry. We pay special attention to inelastic delocalisation, radiation damage, the Čerenkov effect, interference effects of optical excitations and higher diffraction orders on a grating analyser for the cathodoluminescence signal.</jats:p>