Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Habib, Anowarul

  • Google
  • 10
  • 23
  • 33

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2024Probabilistic impact localization in composites using wavelet scattering transform and multi-output Gaussian process regression3citations
  • 2023Image inpainting in acoustic microscopy2citations
  • 2023Image denoising in acoustic microscopy using block-matching and 4D filter18citations
  • 2023Uncertainty Quantification in Acoustic Impedance of Atlantic Salmon Fish Scale using Scanning Acoustic Microscopycitations
  • 2023Automated tilt compensation in acoustic microscopy5citations
  • 2022Image denoising in acoustic field microscopycitations
  • 2020Evaluation of adhesive-free focused high-frequency PVDF copolymer transducers fabricated on spherical cavitiescitations
  • 2018Nonlocal damage mechanics for quantification of health for piezoelectric sensor5citations
  • 2018High frequency copolymer ultrasonic transducer array of size-effective elementscitations
  • 2013Ultrasonic characterization and defect detection in piezoelectric materialscitations

Places of action

Chart of shared publication
Jangid, Naveen
1 / 1 shared
Shelke, Amit
3 / 3 shared
Ojha, Shivam
2 / 2 shared
Prasad, Dilip K.
1 / 1 shared
Yadav, Nitin
1 / 1 shared
Banerjee, Pragyan
1 / 1 shared
Agarwal, Krishna
1 / 1 shared
Melandsø, Frank
6 / 6 shared
Mishra, Sibasish
1 / 1 shared
Pal, Rishant
1 / 1 shared
Ahmad, Azeem
3 / 3 shared
Gupta, Shubham Kumar
3 / 3 shared
Seternes, Tore
1 / 1 shared
Dalmo, Roy Ambil
1 / 1 shared
Agarwal, Komal
1 / 2 shared
Kumar, Prakhar
2 / 2 shared
Melandso, Frank
1 / 1 shared
Decharat, Adit
2 / 2 shared
Wagle, Sanat
2 / 3 shared
Pietsch, Ullrich
1 / 12 shared
Amjad, U.
1 / 2 shared
Banerjee, S.
1 / 11 shared
Jacobsen, Svein Ketil
1 / 1 shared
Chart of publication period
2024
2023
2022
2020
2018
2013

Co-Authors (by relevance)

  • Jangid, Naveen
  • Shelke, Amit
  • Ojha, Shivam
  • Prasad, Dilip K.
  • Yadav, Nitin
  • Banerjee, Pragyan
  • Agarwal, Krishna
  • Melandsø, Frank
  • Mishra, Sibasish
  • Pal, Rishant
  • Ahmad, Azeem
  • Gupta, Shubham Kumar
  • Seternes, Tore
  • Dalmo, Roy Ambil
  • Agarwal, Komal
  • Kumar, Prakhar
  • Melandso, Frank
  • Decharat, Adit
  • Wagle, Sanat
  • Pietsch, Ullrich
  • Amjad, U.
  • Banerjee, S.
  • Jacobsen, Svein Ketil
OrganizationsLocationPeople

article

Automated tilt compensation in acoustic microscopy

  • Ahmad, Azeem
  • Habib, Anowarul
  • Kumar, Prakhar
  • Melandsø, Frank
  • Gupta, Shubham Kumar
Abstract

Scanning acoustic microscopy (SAM) is a potent and nondestructive technique capable of producing three-dimensional topographic and tomographic images of specimens. This is achieved by measuring the differences in time of flight (ToF) of acoustic signals emitted from various regions of the sample. The measurement accuracy of SAM strongly depends on the ToF measurement, which is affected by tilt in either the scanning stage or the sample stage. Hence, compensating for the ToF shift resulting from sample tilt is imperative for obtaining precise topographic and tomographic profiles of the samples in a SAM. In the present work, we propose an automated tilt compensation in ToF of acoustic signal based on proposed curve fitting method. Unlike the conventional method, the proposed approach does not demand manually choosing three separate coordinate points from SAM's time domain data. The effectiveness of the proposed curve fitting method is demonstrated by compensating time shifts in ToF data of a coin due to the presence of tilt. The method is implemented for the correction of different amounts of tilt in the coin corresponding to angles 6.67°, 12.65° and 15.95°. It is observed that the present method can perform time offset correction in the time domain data of SAM with an accuracy of 45 arcsec. The experimental results confirm the effectiveness of the suggested tilt compensation technique in SAM, indicating its potential for future applications.

Topics
  • impedance spectroscopy
  • scanning auger microscopy