| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Zhong, Xiangli
University of Manchester
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (23/23 displayed)
- 2024Understanding Ag liquid migration in SiC through ex-situ and in-situ Ag-Pd/SiC interaction studiescitations
- 2024High resolution analytical microscopy of damage progression within a polyester powder coating after cyclic corrosion testing
- 2023Precursor-Led Grain Boundary Engineering for Superior Thermoelectric Performance in Niobium Strontium Titanate.
- 2023High Power Factor Nb-Doped TiO2 Thermoelectric Thick Films: Toward Atomic Scale Defect Engineering of Crystallographic Shear Structurescitations
- 2023Mitigation effects of over-aging (T73) induced intergranular corrosion on stress corrosion cracking of AA7075 aluminum alloy and behaviors of η phase grain boundary precipitates during the intergranular corrosion formationcitations
- 2023Precursor-Led Grain Boundary Engineering for Superior Thermoelectric Performance in Niobium Strontium Titanatecitations
- 2023High Power Factor Nb-Doped TiO2 Thermoelectric Thick Films:Toward Atomic Scale Defect Engineering of Crystallographic Shear Structurescitations
- 2022Mechanism of FIB-Induced Phase Transformation in Austenitic Steelcitations
- 2021Oxidation and carburization behaviour of two type 316H stainless steel casts in simulated AGR gas environment at 550 and 600 °Ccitations
- 2020Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefactscitations
- 2020Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefactscitations
- 2018Multi-Modal Plasma Focused Ion Beam Serial Section Tomography of an Organic Paint Coatingcitations
- 2017A Single Source Precursor for Tungsten Dichalcogenide Thin Films: Mo1-xWxS2 (0 ≤ x ≤ 1) Alloys by Aerosol-Assisted Chemical Vapor Deposition (AACVD)citations
- 2016Chemical Vapour Deposition of Rhenium Disulfide and Rhenium-Doped Molybdenum Disulfide Thin Films Using Single-Source Precursorscitations
- 2016Xe+ Plasma FIB: 3D Microstructures from Nanometers to Hundreds of Micrometerscitations
- 2016Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimenscitations
- 2016Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimenscitations
- 2015Behavior of alloying elements during anodizing of Mg-Cu and Mg-W alloys in a fluoride/glycerol electrolytecitations
- 2014Formation of barrier-type anodic films on ZE41 magnesium alloy in a fluoride/glycerol electrolytecitations
- 2010Using microwave-assisted powder metallurgy route and nano-size reinforcements to develop high-strength solder compositescitations
- 2009Effect of sub-micron alumina particulates on the properties of A Sn-0.7Cu lead-free solder alloy
- 2008Using microwave assisted powder metallurgy route and nano-size reinforcements to develop high strength lead-free solder composites
- 2005Enhancing damping of pure magnesium using nano-size alumina particulatescitations
Places of action
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article
Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefacts
Abstract
Recently, the dual beam Xe+ plasma focused ion beam (Xe+pFIB) instrument has attracted increasing interest for site‐specific transmission electron microscopy (TEM) sample preparation for a local region of interest as it shows several potential benefits compared to conventional Ga+FIB milling. Nevertheless, challenges and questions remain especially in terms of FIB‐induced artefacts, which hinder reliable S/TEM microstructural and compositional analysis. Here we examine the efficacy of using Xe+ pFIB as compared with conventional Ga+ FIB for TEM sample preparation of Al alloys. Three potential source of specimen preparation artefacts were examined, namely: (1) implantation‐induced defects such as amophisation, dislocations, or ‘bubble’ formation in the near‐surface region resulting from ion bombardment of the sample by the incident beam; (2) compositional artefacts due to implantation of the source ions and (3) material redeposition due to the milling process. It is shown that Xe+pFIB milling is able to produce improved STEM/TEM samples compared to those produced by Ga+ milling, and is therefore the preferred specimen preparation route. Strategies for minimising the artefacts induced by Xe+pFIB and Ga+FIB are also proposed.<br/>Lay DescriptionFIB (focused ion beam) instruments have become one of the most important systems in the preparation of site‐specific TEM specimens, which are typically 50‐100 nm in thickness. TEM specimen preparation of Al alloys is particularly challenging, as convention Ga‐ion FIB produces artefacts in these materials that make microstructural analysis difficult or impossible. Recently, the use of noble gas ion sources, such as Xe, has markedly improved milling speeds and is being used for the preparation of various materials. Hence, it is necessary to investigate the structural defects formed during FIB milling and assess the ion‐induced chemical contamination in these TEM samples. Here we explore the feasibility and efficiency of using Xe+PFIB as a TEM sample preparation route for Al alloys in comparison with the conventional Ga+FIB.