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| Naji, M. |
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| Motta, Antonella |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Azam, Siraj |
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| Azevedo, Nuno Monteiro |
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Mariolle, Denis
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Publications (7/7 displayed)
- 2023ALD-grown tin oxide as an electron selective layer for perovskite/silicon tandem cellscitations
- 2023Wide bandgap material transfer as a flagship technology for future high power devices
- 2023Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach
- 2022ALD-grown SnO$_2$ as an electron selective layer for perovskite/silicon tandem cells
- 2020Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentationcitations
- 2019CF 4 /H 2 Plasma Cleaning of Graphene Regenerates Electronic Properties of the Pristine Materialcitations
- 2010Surface-induced p-type conductivity in ZnO nanopillars investigated by scanning probe microscopycitations
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article
Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation
Abstract
Local mechanical properties of submicron features are of particular interest due to their influence on macroscopic material performance and behaviour. This study is focused on local nanomechanical measurements, based on the latest Atomic Force Microscopy (AFM) mode, where the peak force set point is finely controlled at each pixel. After probe calibration, we evaluate the impact of spring constant of two AFM hand-crafted natural full diamond tips with steel cantilevers, used for mapping. Based on the fast capture of the cantilever deflection at each pixel and real time force curve analysis in the elastic region, AFM local measured contact moduli mappings of the silica beads ('50 GPa) incorporated in an epoxy resin matrix, are compared with those determined using classical instrumented nanoindentation tests. Our analyses show that with the two AFM probes, without local residual deformation, the high moduli of the silica beads measured with this advanced AFM mode are within the standard deviation of the values determined by classical nanoindentation.