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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Bowen, Jacob R.
Technical University of Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (22/22 displayed)
- 2020Enhanced Electromechanical Response in Sm and Nd Co-doped Ceriacitations
- 2018Deposition of highly oriented (K,Na)NbO 3 films on flexible metal substratescitations
- 2018Deposition of highly oriented (K,Na)NbO3 films on flexible metal substratescitations
- 2017Lattice constant measurement from electron backscatter diffraction patternscitations
- 20173D printed barium titanate/poly-(vinylidene fluoride) nano-hybrid with anisotropic dielectric propertiescitations
- 2014On the accuracy of triple phase boundary lengths calculated from tomographic image datacitations
- 2013Transmission Electron Microscopy Specimen Preparation Method for Multiphase Porous Functional Ceramicscitations
- 2013Transmission Electron Microscopy Specimen Preparation Method for Multiphase Porous Functional Ceramicscitations
- 2013Ion beam polishing for three-dimensional electron backscattered diffractioncitations
- 2013Two and three dimensional electron backscattered diffraction analysis of solid oxide cells materials
- 2013Diffusion of Nickel into Ferritic Steel Interconnects of Solid Oxide Fuel/Electrolysis Stackscitations
- 2013Diffusion of Nickel into Ferritic Steel Interconnects of Solid Oxide Fuel/Electrolysis Stackscitations
- 2012Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconiacitations
- 2012Durable and Robust Solid Oxide Fuel Cells
- 2010Texture evolution during tensile necking of copper processed by equal channel angular extrusioncitations
- 2010Quantitative data analysis methods for 3D microstructure characterization of Solid Oxide Cells
- 2008Nanoscale chemical analysis and imaging of solid oxide cellscitations
- 2004Microstructural parameters and flow stress in Al-0.13% Mg deformed by ECAE processingcitations
- 2003The effect of coarse second-phase particles on the rate of grain refinement during severe deformation processingcitations
- 2002First Joint Chinese-Danish Symposium: Characterisation of Microstructures. Extended abstracts
- 2002Orientation correlations in aluminium deformed by ECAEcitations
- 2002Orientation correlations in aluminium deformed by ECAEcitations
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article
Lattice constant measurement from electron backscatter diffraction patterns
Abstract
Kikuchi bands in election backscattered diffraction patterns (EBSP)contain information about lattice constants of crystallographic samplesthat can be extracted via the Bragg equation. An advantage of latticeconstant measurement from EBSPs over diffraction (XRD) is the ability toperform local analysis. In this study, lattice constants of cubic STNand cubic YSZ in the pure materials and in co-sintered composites weremeasured from their EBSPs acquired at 10 kV using a silicon singlecrystal as a calibration reference. The EBSP distortion was corrected byspherical back projection and Kikuchi band analysis was made usingin-house software. The error of the lattice constant measurement wasdetermined to be in the range of 0.09–1.12% compared to valuesdetermined by XRD and from literature. The confidence level of themethod is indicated by the standard deviation of the measurement, whichis approximately 0.04 Å. Studying Kikuchi band size dependence of themeasurement precision shows that the measurement error decays withincreasing band size (i.e. decreasing lattice constant). However, inpractice, the sharpness of wide bands tends to be low due to their lowintensity, thus limiting the measurement precision. Possible methods toimprove measurement precision are suggested.