| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Bowen, Jacob R.
Technical University of Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (22/22 displayed)
- 2020Enhanced Electromechanical Response in Sm and Nd Co-doped Ceriacitations
- 2018Deposition of highly oriented (K,Na)NbO 3 films on flexible metal substratescitations
- 2018Deposition of highly oriented (K,Na)NbO3 films on flexible metal substratescitations
- 2017Lattice constant measurement from electron backscatter diffraction patternscitations
- 20173D printed barium titanate/poly-(vinylidene fluoride) nano-hybrid with anisotropic dielectric propertiescitations
- 2014On the accuracy of triple phase boundary lengths calculated from tomographic image datacitations
- 2013Transmission Electron Microscopy Specimen Preparation Method for Multiphase Porous Functional Ceramicscitations
- 2013Transmission Electron Microscopy Specimen Preparation Method for Multiphase Porous Functional Ceramicscitations
- 2013Ion beam polishing for three-dimensional electron backscattered diffractioncitations
- 2013Two and three dimensional electron backscattered diffraction analysis of solid oxide cells materials
- 2013Diffusion of Nickel into Ferritic Steel Interconnects of Solid Oxide Fuel/Electrolysis Stackscitations
- 2013Diffusion of Nickel into Ferritic Steel Interconnects of Solid Oxide Fuel/Electrolysis Stackscitations
- 2012Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconiacitations
- 2012Durable and Robust Solid Oxide Fuel Cells
- 2010Texture evolution during tensile necking of copper processed by equal channel angular extrusioncitations
- 2010Quantitative data analysis methods for 3D microstructure characterization of Solid Oxide Cells
- 2008Nanoscale chemical analysis and imaging of solid oxide cellscitations
- 2004Microstructural parameters and flow stress in Al-0.13% Mg deformed by ECAE processingcitations
- 2003The effect of coarse second-phase particles on the rate of grain refinement during severe deformation processingcitations
- 2002First Joint Chinese-Danish Symposium: Characterisation of Microstructures. Extended abstracts
- 2002Orientation correlations in aluminium deformed by ECAEcitations
- 2002Orientation correlations in aluminium deformed by ECAEcitations
Places of action
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article
Ion beam polishing for three-dimensional electron backscattered diffraction
Abstract
Serial sectioning by focused ion beam milling for three-dimensional electron backscatter diffraction (3D-EBSD) can create surface damage and amorphization in certain materials and consequently reduce the EBSD signal quality. Poor EBSD signal causes longer data acquisition time due to signal averaging and/or poor 3D-EBSD data quality. In this work a low kV focused ion beam was successfully implemented to automatically polish surfaces during 3D-EBSD of La- and Nb-doped strontium titanate of volume 12.6 × 12.6 × 3.0 μm. The key to achieving this technique is the combination of a defocused low kV high current ion beam and line scan milling. The line scan was used to restrict polishing to the sample surface and the ion beam was defocused to ensure the beam contacted the complete sample surface. In this study 1 min polishing time per slice increases total acquisition time by approximately 3.3% of normal 3D-EBSD mapping compared to a significant increase of indexing percentage and pattern quality. The polishing performance in this investigation is discussed, and two potential methods for further improvement are presented.