Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Shakaff, Ali Yeon Md

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2016Sputter Deposition of Cuprous and Cupric Oxide Thin Films Monitored by Optical Emission Spectroscopy for Gas Sensing Applications8citations
  • 2016Correlation between Microstructure of Copper Oxide Thin Films and its Gas Sensing Performance at Room Temperature6citations
  • 2015Spectroscopic Studies of Magnetron Sputtering Plasma Discharge in Cu/O2/Ar Mixture for Copper Oxide Thin Film Fabrication7citations
  • 2013Morphology, topography and thickness of copper oxide thin films deposited using magnetron sputtering technique5citations

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Wei, Low Jia
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Sahdan, Mohd Zainizan
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Zakaria, Ammar
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Nayan, Nafarizal
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Zain, Ahmad Faizal Mohd
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Ahmad, Mohd Khairul
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Lias, Jais
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Fhong, Soon Chin
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Low, Jia Wei
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Mohd Khairul, Ahmad
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Co-Authors (by relevance)

  • Wei, Low Jia
  • Sahdan, Mohd Zainizan
  • Zakaria, Ammar
  • Nayan, Nafarizal
  • Zain, Ahmad Faizal Mohd
  • Ahmad, Mohd Khairul
  • Lias, Jais
  • Fhong, Soon Chin
  • Low, Jia Wei
  • Mohd Khairul, Ahmad
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article

Spectroscopic Studies of Magnetron Sputtering Plasma Discharge in Cu/O2/Ar Mixture for Copper Oxide Thin Film Fabrication

  • Low, Jia Wei
  • Sahdan, Mohd Zainizan
  • Zakaria, Ammar
  • Nayan, Nafarizal
  • Shakaff, Ali Yeon Md
  • Zain, Ahmad Faizal Mohd
  • Ahmad, Mohd Khairul
Abstract

Magnetron sputtering plasma for the deposition of copper oxide thin film has been investigated using optical emission spectroscopy and Langmuir probe. The intensity of the light emission from atoms and radicals in the plasma were measured using optical emission spectroscopy (OES). Then, Langmuir probe was employed to estimate the plasma density, electron temperature and ion flux. In present studies, reactive copper sputtering plasmas were produced at different oxygen flow rate of 0, 4, 8 and 16 sccm. The size of copper target was 3 inches. The dissipation rf power, Ar flow rate and working pressure were fixed at 400 W, 50 sccm and 22.5 mTorr, respectively. Since the substrate bias plays an important role to the thin film formation, the substrate bias voltages of 0, -40, -60 and -100 V were studied. Based on OES results, oxygen emission increased drastically when the oxygen flow rate above 8 sccm. On the other hand, copper and argon emission decreased gradually. In addition, Langmuir probe results showed a different ion flux when substrate bias voltage was applied. Based on these plasma diagnostic results, it has been concluded that the optimized parameter to produce copper oxide thin film are between -40 to -60 V of substrate bias voltage and between 8 to 12 sccm of oxygen flow rate.

Topics
  • Deposition
  • density
  • thin film
  • Oxygen
  • reactive
  • copper
  • atomic emission spectroscopy