Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2024Comparing portable x-ray fluorescence spectroscopy instrumentation for metallome analysis of herbarium specimens2citations
  • 2022X-ray fluorescence spectroscopy (XRF) for metallome analysis of herbarium specimens19citations

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Purwadi, Imam
2 / 6 shared
Erskine, Peter D.
2 / 6 shared
Ryan, Chris G.
1 / 1 shared
Chart of publication period
2024
2022

Co-Authors (by relevance)

  • Purwadi, Imam
  • Erskine, Peter D.
  • Ryan, Chris G.
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article

Comparing portable x-ray fluorescence spectroscopy instrumentation for metallome analysis of herbarium specimens

  • Casey, Lachlan W.
  • Purwadi, Imam
  • Erskine, Peter D.
Abstract

<p>The use of x-ray fluorescence (XRF) instruments for metallome analysis of herbarium specimens to discover hyperaccumulator plant species has gained popularity, but a growing concern arises about intercomparability from the use of different instrument makes and models. Therefore, this study aimed to assess the performance and comparability of the results generated by three different XRF instruments and three different quantification methods (empirical calibration based on XRF versus inductively coupled plasma atomic emission spectroscopy [ICP-AES] regression, in-built manufacturer algorithms, and an independent GeoPIXE software pipeline based on Fundamental Parameters). Three instruments with distinct specifications were chosen to improve the generalizability of the results, ensuring relevance to a wide range of instruments that may be used in the future for metallome analysis of herbarium specimens. Each instrument was used to scan a representative set of dried hyperaccumulator plant leaf samples, and their accuracy in quantifying elemental concentrations was then compared. The manufacturer algorithms overestimate the elemental concentrations and have the highest errors. The empirical calibrations have the closest mean concentration to the mean concentrations reported by ICP-AES, but can produce negative values. The independent pipeline performance is marginally better than the empirical calibration, but it takes substantially more time and effort to setup the Fundamental Parameters through reverse engineering the instrument hardware parameters. Using the GeoPIXE independent pipeline to extract the XRF peak intensity to use in the empirical calibration performs better than manufacturer algorithms, while avoiding the complicated setup requirements, and this should be considered for further development.</p>

Topics
  • impedance spectroscopy
  • atomic emission spectroscopy
  • Auger electron spectroscopy
  • fluorescence spectroscopy
  • X-ray fluorescence spectroscopy