Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Sverdlov, Viktor

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TU Wien

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2022Spin Transfer Torque Evaluation Based on Coupled Spin and Charge Transport: A Finite Element Method Approachcitations
  • 2013strain induced reduction of surface roughness dominated spin relaxation in mosfets1citations
  • 2012a multi scale modeling approach to non radiative multi phonon transitions at oxide defects in mos structures18citations
  • 2011perspectives of silicon for future spintronic applications from the peculiarities of the subband structure in thin filmscitations
  • 2009valley splitting in thin silicon films from a two band k p modelcitations
  • 2009thickness dependence of the effective masses in a strained thin silicon film5citations

Places of action

Chart of shared publication
Fiorentini, Simone
1 / 1 shared
Ender, Johannes
1 / 1 shared
Goes, Wolfgang
1 / 2 shared
Selberherr, Siegfried
5 / 13 shared
Osintsev, Dmitri
1 / 1 shared
Stanojevic, Zlatan
1 / 3 shared
Baumgartner, Oskar
5 / 7 shared
Grasser, Tibor
1 / 3 shared
Schanovsky, Franz
3 / 3 shared
Windbacher, Thomas
3 / 3 shared
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2022
2013
2012
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2009

Co-Authors (by relevance)

  • Fiorentini, Simone
  • Ender, Johannes
  • Goes, Wolfgang
  • Selberherr, Siegfried
  • Osintsev, Dmitri
  • Stanojevic, Zlatan
  • Baumgartner, Oskar
  • Grasser, Tibor
  • Schanovsky, Franz
  • Windbacher, Thomas
OrganizationsLocationPeople

article

valley splitting in thin silicon films from a two band k p model

  • Baumgartner, Oskar
  • Selberherr, Siegfried
  • Windbacher, Thomas
  • Sverdlov, Viktor
  • Schanovsky, Franz
Abstract

The unprimed valley structure in (001) silicon thin films has been analyzed within the two-band k·p model. It is shown that the two-fold degeneracy of the unprimed subbands can be lifted leading to the socalled valley splitting which is proportional to the strength of the perpendicular magnetic field. The valley splitting can be enhanced in 〈110〉 oriented point contacts, while it is suppressed in a 〈100〉 point contact. Finally, the valley splitting can be controlled and made larger than the Zeeman splitting by shear strain.This makes silicon very attractive for spintronic applications.

Topics
  • impedance spectroscopy
  • thin film
  • strength
  • Silicon