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| Naji, M. |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Azevedo, Nuno Monteiro |
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| Rignanese, Gian-Marco |
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Bösch, Wolfgang
Graz University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2023On the Difficulties to Determine the Intrinsic Material Parameters for MnZn Ferritescitations
- 2023Experimental analysis of grounded coplanar waveguide structures based on different PCB processes with uncertainty analysiscitations
- 2022mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughnesscitations
- 2022Complex Permittivity Measurement of Dielectric Substrates at Millimeter-wave Frequencies
- 2021Additive Manufacturing of Non-homogenous Dielectric Waveguide Structures and Filterscitations
- 2020A D-band 3D printed antennacitations
- 2019Compact broadband frequency selective microstrip antenna and its application to indoor positioning systems for wireless networkscitations
- 2018Emerging technologies and concepts for 5G applications - A. making additive manufactured ceramic microwave filters ready for 5Gcitations
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article
mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness
Abstract
As many emerging technologies require the use of high-speed signals, the understanding of dielectric properties of materials used in manufacturing printed circuit boards (PCBs) is an essential aspect for accurate high-speed circuit designs, especially at millimeter-wave (mm-wave) frequencies. This work demonstrates a methodology for extracting complex relative permittivity of dielectric substrates covering mm-wave frequencies. For this purpose, low-temperature cofired ceramic (LTCC) substrate was measured up to 85 GHz and its complex relative permittivity was extracted. The approach used in this work is based on multiline thru–reflect–line (TRL) calibration for measuring the propagation constant and electromagnetic (EM) simulations to estimate the losses contributed by the conductor while accounting for surface roughness. An estimate of complex relative effective permittivity is obtained, from which the actual relative dielectric constant and the loss tangent of LTCC substrate are extracted. The estimated values for the relative dielectric constant and the loss tangent show an excellent agreement compared with the results obtained via split cavity resonator measurements.