Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2007Simple technique for direct patterning of nanowires using a nanoslit shadow-mask2citations

Places of action

Chart of shared publication
Jansen, Henricus V.
1 / 13 shared
Tas, Niels Roelof
1 / 12 shared
Van Den Berg, Albert
1 / 40 shared
Carlen, Edwin
1 / 8 shared
Gadgil, V. J.
1 / 1 shared
Chart of publication period
2007

Co-Authors (by relevance)

  • Jansen, Henricus V.
  • Tas, Niels Roelof
  • Van Den Berg, Albert
  • Carlen, Edwin
  • Gadgil, V. J.
OrganizationsLocationPeople

document

Simple technique for direct patterning of nanowires using a nanoslit shadow-mask

  • Jansen, Henricus V.
  • Tas, Niels Roelof
  • Van Den Berg, Albert
  • Tong, D. H.
  • Carlen, Edwin
  • Gadgil, V. J.
Abstract

Nanowires of vaious lengths and widths have been fabricated using a wafer-scale shadow mask with deposition windows, or nanoslits, created with focused ion beam machining. Metallic nanowires with widths down to 50 nm and lengths up to 100 micrometers have been realized. Measurements of electrical I-V characteristics show linear behavior of nanowires with widths and thickness each around 50 nm

Topics
  • Deposition
  • focused ion beam