Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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García Núñez, Carlos

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University of Glasgow

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (14/14 displayed)

  • 2024Giant piezoelectric effect induced by porosity in inclined ZnO thin films2citations
  • 2024Optical and structural properties of silicon nitride thin films deposited by plasma enhanced chemical vapor deposition for high reflectance optical mirrorscitations
  • 2024Giant Piezoelectric Effect Induced by Porosity in Inclined ZnO Thin Films2citations
  • 2021Glancing angle deposition of nanostructured ZnO films for ultrasonics3citations
  • 2019Graphene–graphite polyurethane composite based high‐energy density flexible supercapacitors94citations
  • 2018Electronic skin with energy autonomy and distributed neural data processingcitations
  • 2018A novel growth method to improve the quality of GaAs nanowires grown by Ga-assisted chemical beam epitaxy9citations
  • 2017Metal-assisted chemical etched Si nanowires for high-performance large area flexible electronicscitations
  • 2016Fabrication and characterization of multiband solar cells based on highly mismatched alloyscitations
  • 2015Contribution to the Development of Electronic Devices Based on Zn3N2 Thin Films, and ZnO and GaAs Nanowirescitations
  • 2013p-type CuO nanowire photodetectorscitations
  • 2013Sub-micron ZnO:N particles fabricated by low voltage electrical discharge lithography on Zn3N2 sputtered films1citations
  • 2013WO3 nanoparticle-functionalized nanowires for NOx sensingcitations
  • 2011Effect of the deposition temperature on the properties of Zn3N2 layers grown by rf magnetron sputteringcitations

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Hughes, Dave Allan
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Garcia, Manuel Pelayo
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García, Basilio Javier
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Baghini, Mahdieh Shojaei
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Saunders, Karen
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Mazur, Michał
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Pau, J. L.
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Piqueras, J.
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Coya, Carmen
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Piqueras, Juan
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Pau, Jose Luis
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Cervera, M.
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Co-Authors (by relevance)

  • Hughes, Dave Allan
  • Saddik, Karim Ben
  • Gibson, Desmond
  • Garcia, Manuel Pelayo
  • García, Basilio Javier
  • Baghini, Mahdieh Shojaei
  • Saunders, Karen
  • Mazur, Michał
  • Clark, Caspar
  • García Carretero, Basilio Javier
  • Pelayo García, Manuel
  • Ben Saddik, Karim
  • Gibson, Des
  • Hughes, David Allan
  • Mcaughey, Kevin Luke
  • Manjakkal, Libu
  • Dahiya, Ravinder
  • Navaraj, William Taube
  • Dahiya, R.
  • Shakthivel, D.
  • Navaraj, W. Taube
  • Liu, F.
  • García, Basilio J.
  • Braña, Alejandro F.
  • López, Nair
  • Taube, William
  • Gregory, D.
  • Yu, Kinman
  • Walukiewicz, Wladyslaw
  • Hernández Muñoz, María Jesús
  • García, B. J.
  • Braña De Cal, Alejandro Francisco
  • Martínez, M.
  • Cervera Alajarín, Manuel
  • Ruiz, E.
  • Pau, J. L.
  • Marín, A. García
  • Piqueras, J.
  • Jiménez-Trillo, Juan
  • Vélez, Miguel García
  • Coya, Carmen
  • Álvarez, Angel Luis
  • Piqueras, Juan
  • Pau, Jose Luis
  • Cervera, M.
  • Hernandez, M. J.
OrganizationsLocationPeople

document

Effect of the deposition temperature on the properties of Zn3N2 layers grown by rf magnetron sputtering

  • García Núñez, Carlos
  • Pau, J. L.
  • Cervera, M.
  • Hernandez, M. J.
  • Piqueras, J.
Abstract

In this work, polycrystalline zinc nitride films were prepared on Si and glass substrates by rf magnetron sputtering in N2 ambient using Zn as a target. Substrate temperature (Ts) was different for each deposition process ranging from 298 K to 523 K. Optical transmission experiments showed that the optical band gap of the resultant layers decreased as Ts increased. X-ray diffraction scans presented a pattern of oriented crystals along the (100) direction at low Ts in contrast to the highly disoriented patterns obtained at high Ts. Hall measurements were carried out and exhibited n-type character for all samples, with mobilities ranging between 10 and 30 cm2/Vs, and a resistivity reduction as substrate temperature increases. By scanning electron microscopy, it was possible to study the grain structure forming the surface of zinc nitride. The size of the grains became larger as Ts increased, which accounts for the reduction of the electrical resistivity.

Topics
  • Deposition
  • surface
  • grain
  • resistivity
  • scanning electron microscopy
  • x-ray diffraction
  • experiment
  • zinc
  • glass
  • glass
  • nitride
  • forming