| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Villeneuve-Faure, Christina
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (20/20 displayed)
- 2024Investigation of the effect of AgNPs-based nanocomposites on Pseudomonas aeruginosa biofilm formation under dynamic conditions at low wall shear stress
- 2024Pulsed Aerosol-Assisted Low-Pressure Plasma for Thin-Film Depositioncitations
- 2024Study of Injection and Retention of Charges in Silica-Based Nanocomposite Dielectrics: Impact of Size of Silver Nanoparticles
- 2023Impact of Silver Nanoparticles Embedded in a Silica Layer on the Surface Morphology of the Structure: Evaluation by Atomic Force Microscopycitations
- 2023Hybrid Photoelectrocatalytic TiO2-Co3O4/Co(OH)2 Materials Prepared from Bio-Based Surfactants for Water Splittingcitations
- 2023Photo-electrocatalytic performance of poly(3,4-ethylenedioxythiophene)/TiO2 nano-tree films deposited by oCVD/CVD for H2 productioncitations
- 2023Methodology of backside preparation applied on a MRAM to lead a logical investigation with a near-field probecitations
- 2023SiC Doping Impact during Conducting AFM under Ambient Atmospherecitations
- 2021In-and out-plane transport properties of chemical vapor deposited TiO 2 anatase filmscitations
- 2021In- and out-plane transport properties of chemical vapor deposited TiO2 anatase filmscitations
- 2021Nanoscale mechanical and electrical characterization of the interphase in polyimide/silicon nitride nanocompositescitations
- 2021Temperature Influence on PI/Si3N4 Nanocomposite Dielectric Properties: A Multiscale Approachcitations
- 2020Morphological, structural, optical, and electrical study of nanostructured thin films: Charge transport mechanism of p-type Co3O4citations
- 2020A Multiscale Characterization of Nanodielectrics: the Case of PI/Si3N4 Nanocompositecitations
- 2018The "spectro-inside" concept based on using AgNPs nanocomposites for biosensing the adsorption of proteins on solid surfaces
- 2018Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocompositescitations
- 2018Characterization of the electrical behaviour of thin dielectric films at nanoscale using technics methods derived from Atomic Force Microscopy : application to plasma deposited AgNPs-based nanocomposites
- 2016Plasma based concept for engineering of multifunctional materials with application to synthesis of large-area plasmonic substrates and to control the charge injection in dielectrics
- 2015Correlation of structural organisation and electronic properties of P3HT: Ni-complexes thin films for organic bulk heterojunction solar cells
- 2012Towards large scale aligned carbon nanotubes based composite production
Places of action
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conferencepaper
Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited AgNPs-Based Nanocomposites
Abstract
Recent advances in the development of micro-and nano-devices call for applications of thin nanocomposite dielectric films (thickness less than few tens of nanometers) with tuneable electrical properties. For optimization purposes, their behaviour under electrical stress needs to be probed at relevant scale, i.e. nanoscale. To that end electrical modes derived from Atomic Force Microscopy (AFM) appear the best methods due to their nanoscale resolution and non-destructive nature which permits in-situ characterization. The potentialities of electrical modes derived from AFM are presented in this work. The samples under study consist of plasma processed thin dielectric silica layers with embedded silver nanoparticles (AgNPs). Charge injection at local scale, performed by using AFM tip, is investigated by Kelvin Probe Force Microscopy (KPFM). Modulation of the local permittivity induced by the presence of AgNPs is assessed by Electrostatic Force Microscopy (EFM).