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Ledenyov, Dimitri
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Publications (4/4 displayed)
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
- 2003Microwave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator techniquecitations
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booksection
Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators
Abstract
A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O/sub 3/, LaAlO/sub 3/, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE/sub 01/spl delta// mode resonant frequencies and unloaded Q/sub 0/-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively.