Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2020Massive Parallel NEMS Flow Restriction Fabricated Using Self-Aligned 3D-Crystallographic Nanolithography2citations

Places of action

Chart of shared publication
Kampen, Chris P. Van
1 / 1 shared
Tas, Niels R.
1 / 2 shared
Gardeniers, Han
1 / 26 shared
Berenschot, Erwin J. W.
1 / 36 shared
Burger, Gert Jan
1 / 1 shared
Tiggelaar, Roald M.
1 / 4 shared
Chart of publication period
2020

Co-Authors (by relevance)

  • Kampen, Chris P. Van
  • Tas, Niels R.
  • Gardeniers, Han
  • Berenschot, Erwin J. W.
  • Burger, Gert Jan
  • Tiggelaar, Roald M.
OrganizationsLocationPeople

document

Massive Parallel NEMS Flow Restriction Fabricated Using Self-Aligned 3D-Crystallographic Nanolithography

  • Kampen, Chris P. Van
  • Tas, Niels R.
  • Gardeniers, Han
  • Sanders, Remco G.
  • Berenschot, Erwin J. W.
  • Burger, Gert Jan
  • Tiggelaar, Roald M.
Abstract

<p>We introduce a massive parallel NEMS flow restriction nano-slit array fabricated in a wafer scale process using self-aligned 3D-nanolithography on sharp convex corners created by anisotropic etching of the silicon crystal. The device consists of an array of 50.000 slits, all having a length of ∼360 nm and a width of ∼6 nm. A relatively low resistance (short pore throat) configuration ensures high throughput on the order of 25μ g/s at 4 bar differential pressure. A dedicated hierarchical mechanical design consisting of on-membrane supports within a larger support structure enables operation pressures over 6 bar.</p>

Topics
  • pore
  • anisotropic
  • Silicon
  • etching
  • aligned