Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 20030.5-W single transverse-mode operation of an 850-nm diode-pumped surface-emitting semiconductor laser101citations

Places of action

Chart of shared publication
Ferguson, A. I.
1 / 1 shared
Dawson, Md
1 / 39 shared
Calvez, S.
1 / 9 shared
Jeon, C. W.
1 / 4 shared
Abram, R. H.
1 / 1 shared
Burns, D.
1 / 3 shared
Hastie, Jennifer E.
1 / 3 shared
Riis, Erling
1 / 1 shared
Chart of publication period
2003

Co-Authors (by relevance)

  • Ferguson, A. I.
  • Dawson, Md
  • Calvez, S.
  • Jeon, C. W.
  • Abram, R. H.
  • Burns, D.
  • Hastie, Jennifer E.
  • Riis, Erling
OrganizationsLocationPeople

article

0.5-W single transverse-mode operation of an 850-nm diode-pumped surface-emitting semiconductor laser

  • Ferguson, A. I.
  • Dawson, Md
  • Calvez, S.
  • Jeon, C. W.
  • Abram, R. H.
  • Burns, D.
  • Hastie, Jennifer E.
  • Hopkins, J. M.
  • Riis, Erling
Abstract

We report the power scaling of a diode-pumped GaAs-based 850-nm vertical external-cavity surface-emitting laser, by use of an intracavity silicon carbide (SiC) heatspreader optically contacted to the semiconductor surface. To our knowledge, this is the first demonstration of bonding of SiC to a III-V semiconductor structure using the technique of liquid capillarity. High output power of >0.5 W in a circularly symmetric, TEM/sub 00/ output beam has been achieved with a spectral shift of only 0.6 nm/W of pump power. No thermal rollover was evident up to the highest pump power available, implying significant further output-power scaling potential using this approach.

Topics
  • impedance spectroscopy
  • surface
  • carbide
  • transmission electron microscopy
  • Silicon
  • III-V semiconductor