• Katzer, D. Scott
• Ancona, Mario G.
• Deen, David A.
• Meyer, David J.
• Binari, Steven C.
• Downey, Brian P.
• Roussos, Jason A.
• Evans, Keith R.
• Storm, David F.
• Gougousi, Theodosia
• Paskova, Tanya
• Bass, Robert

Abstract

<p>AlN/GaN heterostructures with 1700-cm(2)/V . s Hall mobility have been grown by molecular beam epitaxy on freestanding GaN substrates. Submicrometer gate-length (L-G) metal-oxide-semiconductor (MOS) high-electron-mobility transistors (HEMTs) fabricated from this material show excellent dc and RF performance. L-G = 100 nm devices exhibited a drain current density of 1.5 A/mm, current gain cutoff frequency f(T) of 165 GHz, a maximum frequency of oscillation f(max) of 171 GHz, and intrinsic average electron velocity v(e) of 1.5 x 10(7) cm/s. The 40-GHz load-pull measurements of L-G = 140 nm devices showed 1-W/mm output power, with a 4.6-dB gain and 17% power-added efficiency. GaN substrates provide a way of achieving high mobility, high v(e), and high RF performance in AlN/GaN transistors.</p>

Topics

• density
• mobility
• semiconductor
• current density