Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2018Effect of thermal annealing on stress relaxation and crystallisation of ion beam sputtered amorphous Si1-xGex thin films9citations
  • 2017Large-Area MEMS Tunable Fabry-Perot Filters for Multi/Hyperspectral Infrared Imaging33citations
  • 2016Investigation of Thermal Expansion Effects on Si-Based MEMS Structures4citations
  • 2014Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording2citations

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Chart of shared publication
Brookshire, K.
1 / 1 shared
Liu, Yinong
2 / 35 shared
Guo, F.
1 / 15 shared
Martyniuk, Mariusz
4 / 16 shared
Faraone, Lorenzo
4 / 31 shared
Dell, John
2 / 20 shared
Bumgarner, John
1 / 1 shared
Tripathi, Dhirendra Kumar
1 / 2 shared
Ren, Yongling
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Mao, Haifeng
1 / 1 shared
Antoszewski, Jaroslaw
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Rafiei, Ramin
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Brookshire, Kirsten
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Baldwin, D.
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Jeffery, R.
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Woodward, R. C.
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Krishnan, R. N.
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Cliff, J.
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Co-Authors (by relevance)

  • Brookshire, K.
  • Liu, Yinong
  • Guo, F.
  • Martyniuk, Mariusz
  • Faraone, Lorenzo
  • Dell, John
  • Bumgarner, John
  • Tripathi, Dhirendra Kumar
  • Ren, Yongling
  • Mao, Haifeng
  • Antoszewski, Jaroslaw
  • Rafiei, Ramin
  • Brookshire, Kirsten
  • Baldwin, D.
  • Jeffery, R.
  • Woodward, R. C.
  • Krishnan, R. N.
  • Cliff, J.
OrganizationsLocationPeople

article

Large-Area MEMS Tunable Fabry-Perot Filters for Multi/Hyperspectral Infrared Imaging

  • Dell, John
  • Bumgarner, John
  • Martyniuk, Mariusz
  • Tripathi, Dhirendra Kumar
  • Ren, Yongling
  • Mao, Haifeng
  • Antoszewski, Jaroslaw
  • Silva, Dilusha
  • Faraone, Lorenzo
Abstract

<p>This paper reports on a MEMS tunable Fabry-Perot filter technology capable of achieving nanometer-scale optical flatness across a large mirror area of up to square centimeters without any extraneous stress management techniques. The device employs a single-layer tensile silicon or germanium membrane for the suspended top mirror. Optical characterization of the fabricated single-membrane-based tunable filters for the SWIR, MWIR, and LWIR is presented. The fabricated 1000-μm dimension Si-membrane-based SWIR and MWIR filters are demonstrated with a wavelength tuning range of 1.77-2.42 and 4.1-4.9 μm, respectively, while the fabricated 200-μm-dimension Ge-membrane-based LWIR filter is demonstrated with a wavelength tuning range of 8.5-11.46 μm. All these filters are shown to achieve transmission characteristics that exceed the optical requirements for multispectral imaging applications. A large-area 1-cm dimension Si membrane-based SWIR tunable Fabry-Perot filter for multispectral imaging is demonstrated as a proof-of-concept, showing an excellent surface flatness in the order of 25 nm and an excellent optical uniformity with transmission peak wavelength variability less than 3% across the entire 1-cm dimension optical imaging area. In addition, the optical transmission behavior of the Fabry-Perot filters based on three-layer Si or Ge-based air-spaced DBRs for SWIR, MWIR, and LWIR is modeled, demonstrating that these filters can achieve a fine spectral resolution of several tens of nanometers suitable for hyperspectral imaging applications.</p>

Topics
  • impedance spectroscopy
  • surface
  • laser emission spectroscopy
  • Silicon
  • Germanium