Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Hay, J.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2013Strain-rate sensitivity (SRS) of nickel by instrumented indentation3citations
  • 2003Low loss, thin p-clad 980-nm InGaAs semiconductor laser diodes with an asymmetric structure design33citations

Places of action

Chart of shared publication
Göken, Mathias
1 / 350 shared
Durst, K.
1 / 74 shared
Maier, V.
1 / 19 shared
Buda, M.
1 / 9 shared
Chart of publication period
2013
2003

Co-Authors (by relevance)

  • Göken, Mathias
  • Durst, K.
  • Maier, V.
  • Buda, M.
OrganizationsLocationPeople

article

Low loss, thin p-clad 980-nm InGaAs semiconductor laser diodes with an asymmetric structure design

  • Hay, J.
  • Buda, M.
Abstract

<p>Thin p-clad InGaAs ridge waveguide quantum-well lasers having an asymmetric structure design were fabricated. The internal absorption coefficient is as low as 2.5 cm<sup>-1</sup>, due to the restricted field extension in the 0.3-μm-thick p-type top AlGaAs cladding layer. Ti-Pt-Au metallization is used outside the ridge to provide adherence on the oxide while Au directly contacts the ridge region. It is shown that the most likely source of loss in these thin p-clad devices is scattering at the rough interface between Au and the p<sup>++</sup> top GaAs layer, after ohmic contact heat treatment.</p>

Topics
  • impedance spectroscopy
  • semiconductor