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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Pommerenke, David
Graz University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (10/10 displayed)
- 2023On the Difficulties to Determine the Intrinsic Material Parameters for MnZn Ferritescitations
- 2023The distribution of discharge amplitudes of randomly colliding charged spherescitations
- 2023A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials
- 2018Characterization of relative complex permittivity and permeability for magneto-dielectric sheetscitations
- 2018Measurement of Dielectric Constant and Cross-Sectional Variations of a Wirecitations
- 2018Common-mode impedance of a ferrite toroid on a cable harness
- 2012Nonlinear capacitors for ESD protectioncitations
- 2011Rapid rotary scanner and portable coherent wideband Q-band transceiver for high-resolution millimeter-wave imaging applicationscitations
- 2002Efficient FDTD simulation of fields in coaxial cables with multi-layered insulation partially formed by dispersive layers of extremely high permittivitycitations
- 2000Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables
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document
A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials
Abstract
Thin sheet EMC suppression material is often manufactured in multiple layers. These artificial materials can be made by mixing metal flakes into polymers. This leads to anisotropic behavior in the electromagnetic properties of the material. This paper presents a new method for determining the anisotropic behavior of magneto-dielectric thin film materials, focusing on a measurement of both in-plane and normal-to-plane permittivity. In this procedure, the in-plane permittivity and permeability are measured using the well-known material characterization technique, and then the normal to plane permittivity is measured using the proposed technique. This method determines the value of the dielectric constant using a simple microstrip line structure. Simulation and measurement are used to verify the validity of the method.