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Geyer, R. G.
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document
Dielectric characterization of single-crystal LiF, CaF/sub 2/, MgF/sub 2/, BaF/sub 2/, and SrF/sub 2/at microwave frequencies
Abstract
The microwave dielectric properties of single-crystal LiF, CaF/sub 2/, MgF/sub 2/, BaF/sub 2/, and SrF/sub 2/, synthesized by Stockbarger melt-growth techniques, are measured using cylindrical specimens as TE/sub 01/spl delta// dielectric resonators enclosed in a cylindrical cavity. Single-crystal permittivity and dielectric loss tangent were evaluated at fixed frequencies between 7 and 9 GHz and over a temperature range from -75 to 150/spl deg/C. The real permittivities of the measured fluorides increase quasi-linearly with temperature, permitting evaluation of the thermal coefficients of permittivity. The dielectric loss tangents increase approximately linearly with frequency, so that Qf (GHz) products at room temperature for BaF/sub 2/, SrF/sub 2/, CaF/sub 2/, LiF, and MgF/sub 2/ (normal to c-axis) are 57600, 73000, 92000, 192400, and 458600, respectively. The dielectric data supports existing ion polarizabilities that are used with molar volumes and molecular additivity rules to estimate the permittivities of more complex fluorides whose values have not been experimentally determined.