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| Naji, M. |
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| Motta, Antonella |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Rančić, M. |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Blackburn, J. F.
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Publications (5/5 displayed)
- 2016Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscopecitations
- 2014A near-field scanning microwave microscope for measurement of the permittivity and loss of high-loss materialscitations
- 2011Erratum: Small-scale piezoelectric devices: Pyroelectric contributions to the piezoelectric response (Journal of Applied Physics (2010) 107 (104118))
- 2010Small-scale piezoelectric devices: Pyroelectric contributions to the piezoelectric responsecitations
- 2010Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanatecitations
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document
A near-field scanning microwave microscope for measurement of the permittivity and loss of high-loss materials
Abstract
<p>The design and calibration of a Near-Field Scanning Microwave Microscope (NSMM) for measurement of permittivity and loss on the small scale are described. The instrument described uses a wire probe that is electromagnetically coupled to a resonant cavity. Using an electrostatic model based on image charges (Gao and Xiang 1998) permittivity and loss may be determined. The paper describes progress in two specific areas: (i) The implementation of an optical beam-deflection method for obtaining contact mode between the probe tip and specimens. (ii) Improvements to the calibration process to improve the traceability and accuracy of the measurement of loss by using the Laplacian 'complex frequency' in the image-charge model. This is demonstrated by measurements on polar liquids.</p>