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Jacob, M. V.
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Publications (10/10 displayed)
- 2008Microwave Characterisation of MgTe2O5 using quasi TE0np Mode Dielectric Resonator Technique
- 2008Bi-2(Zn2/3-x/3Nb4/3-2x/3Tix)O-7 Ceramics - A High Permittivity Microwave Dielectrics for Electronics Application
- 2007Non-destructive complex permittivity measurement of low permittivity thin film materialscitations
- 2006Cryogenic complex anisotropic permittivity of magnesium fluoridecitations
- 2006Dielectric characterisation of Barium Fluoride at cryogenic temperatures using TE011 and quasi TE0mn mode dielectric resonatorscitations
- 2005Low temperature complex permittivity of MgF/sub 2/ at microwave frequencies from TE/sub 01/spl delta// modescitations
- 2004Recent advances in measurements of permittivity and dielectric losses at microwave frequenciescitations
- 2004Microwave characterization of (La,Sr)(AlTa)O3 using TE011 mode dielectric resonator
- 2003Lithium tantalate - a high permittivity dielectric material for microwave communication systemscitations
- 2003Microwave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator techniquecitations
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document
Low temperature complex permittivity of MgF/sub 2/ at microwave frequencies from TE/sub 01/spl delta// modes
Abstract
MgF/sub 2/ is a hard and birefringent crystal with low refractive index and a wide transmission range and is widely used in prisms and optical windows. The RF and microwave losses of magnesium fluoride (MgF/sub 2/) crystal are low as compared to other fluorides but not well investigated. In this paper the complex permittivity of MgF/sub 2/ studied using a TE/sub 01/spl delta// dielectric post resonator technique as a function of frequency and temperature is reported. Measured values of perpendicular component of the real part of permittivity are 5.41 and 5.33 and of the loss tangent are 1/spl times/10/sup -6/ and 2.7/spl times/10/sup -6/ at frequencies 9.2 and 20.5 GHz respectively at a temperature of 15K.