Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Science and Technology Facilities Council

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2023Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae9citations
  • 2022Polar Crystal Habit and 3D Electron Diffraction Reveal the Malaria Pigment Hemozoin as a Selective Mixture of Centrosymmetric and Chiral Stereoisomers2citations

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Naismith, James
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Glen, Thomas
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Owen, C. David
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Crawshaw, Adam
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Stuart, David
1 / 2 shared
Siebert, Charles
1 / 1 shared
Dumoux, Maud
1 / 1 shared
Parkhurst, James M.
1 / 1 shared
Evans, Gwyndaf
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Nunes, Pedro
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Regev-Rudzki, Neta
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Mullick, Debakshi
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Zhang, Peijun
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Biran, Idan
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Marom, Noa
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Owen, David
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2022

Co-Authors (by relevance)

  • Naismith, James
  • Glen, Thomas
  • Owen, C. David
  • Crawshaw, Adam
  • Stuart, David
  • Siebert, Charles
  • Dumoux, Maud
  • Parkhurst, James M.
  • Evans, Gwyndaf
  • Nunes, Pedro
  • Regev-Rudzki, Neta
  • Mullick, Debakshi
  • Zhang, Peijun
  • Houben, Lothar
  • Biran, Idan
  • Marom, Noa
  • Owen, David
  • Gruene, Tim
  • Klar, Paul Benjamin
  • Gilchrist, James B.
  • Palatinus, Lukas
  • Leiserowitz, Leslie
  • Dzikowski, Ron
  • Wen, Wen
OrganizationsLocationPeople

article

Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae

  • Naismith, James
  • Glen, Thomas
  • Owen, C. David
  • Crawshaw, Adam
  • Waterman, David
  • Stuart, David
  • Siebert, Charles
  • Dumoux, Maud
  • Parkhurst, James M.
  • Evans, Gwyndaf
  • Nunes, Pedro
Abstract

<jats:p>Three-dimensional electron diffraction (3DED) from nanocrystals of biological macromolecules requires the use of very small crystals. These are typically less than 300 nm-thick in the direction of the electron beam due to the strong interaction between electrons and matter. In recent years, focused-ion-beam (FIB) milling has been used in the preparation of thin samples for 3DED. These instruments typically use a gallium liquid metal ion source. Inductively coupled plasma (ICP) sources in principle offer faster milling rates. Little work has been done to quantify the damage these sources cause to delicate biological samples at cryogenic temperatures. Here, an analysis of the effect that milling with plasma FIB (pFIB) instrumentation has on lysozyme crystals is presented. This work evaluates both argon and xenon plasmas and compares them with crystals milled with a gallium source. A milling protocol was employed that utilizes an overtilt to produce wedge-shaped lamellae with a shallow thickness gradient which yielded very thin crystalline samples. 3DED data were then acquired and standard data-processing statistics were employed to assess the quality of the diffraction data. An upper bound to the depth of the pFIB-milling damage layer of between 42.5 and 50 nm is reported, corresponding to half the thickness of the thinnest lamellae that resulted in usable diffraction data. A lower bound of between 32.5 and 40 nm is also reported, based on a literature survey of the minimum amount of diffracting material required for 3DED.</jats:p>

Topics
  • impedance spectroscopy
  • electron diffraction
  • grinding
  • laser emission spectroscopy
  • milling
  • Gallium
  • lamellae