Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2014Anisotropic elasticity of silicon and its application to the modelling of X-ray optics77citations

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Rio, Manuel Sanchez Del
1 / 1 shared
Zhang, Lin
1 / 13 shared
Detlefs, Carsten
1 / 8 shared
Cloetens, Peter
1 / 24 shared
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2014

Co-Authors (by relevance)

  • Rio, Manuel Sanchez Del
  • Zhang, Lin
  • Detlefs, Carsten
  • Cloetens, Peter
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article

Anisotropic elasticity of silicon and its application to the modelling of X-ray optics

  • Rio, Manuel Sanchez Del
  • Barrett, Raymond
  • Zhang, Lin
  • Detlefs, Carsten
  • Cloetens, Peter
Abstract

The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young's modulus, the shear modulus and Poisson's ratio as well. Computer codes (in Matlab and Python) have been developed to calculate these anisotropic elasticity parameters for a silicon crystal in any orientation. These codes facilitate the evaluation of these anisotropy effects in silicon for applications such as microelectronics, microelectromechanical systems and X-ray optics. For mechanically bent X-ray optics, it is shown that the silicon crystal orientation is an important factor which may significantly influence the optics design and manufacturing phase. Choosing the appropriate crystal orientation can both lead to improved performance whilst lowering mechanical bending stresses. The thermal deformation of the crystal depends on Poisson's ratio. For an isotropic constant Poisson's ratio, nu, the thermal deformation (RMS slope) is proportional to (1 + nu). For a cubic anisotropic material, the thermal deformation of the X-ray optics can be approximately simulated by using the average of nu(12) and nu(13) as an effective isotropic Poisson's ratio, where the direction 1 is normal to the optic surface, and the directions 2 and 3 are two normal orthogonal directions parallel to the optical surface. This average is independent of the direction in the optical surface (the crystal plane) for Si(100), Si(110) and Si(111). Using the effective isotropic Poisson's ratio for these orientations leads to an error in thermal deformation smaller than 5.5%

Topics
  • impedance spectroscopy
  • surface
  • phase
  • anisotropic
  • Silicon
  • elasticity
  • isotropic
  • crystalline lattice
  • Poisson's ratio