| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Viart, Nathalie
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2023Room-temperature magnetism and controlled cation distribution in vanadium ferrite thin filmscitations
- 2023Spin transport properties of spinel vanadate-based heterostructurescitations
- 2023Synthesis of infinite-layer nickelates and influence of the capping-layer on magnetotransportcitations
- 2022Nonmonotonous temperature fluctuations of the orbital moment and spin-orbit coupling in multiferroic gallium ferrite thin filmscitations
- 2022Unveiling Unconventional Ferroelectric Switching in Multiferroic Ga0.6 Fe1.4O3 Thin Films Through Multiscale Electron Microscopy Investigations
- 2022Thermal Spin-Current Generation in the Multifunctional Ferrimagnet Ga 0.6 Fe 1.4 O 3citations
- 2021Spin current transport in hybrid Pt / multifunctional magnetoelectric Ga0.6Fe1.4O3 bilayerscitations
- 2019Nanosecond electron pulses in the analytical electron microscopy of a fast irreversible chemical reactioncitations
- 2019Ultrathin regime growth of atomically flat multiferroic gallium ferrite films with perpendicular magnetic anisotropycitations
- 2018Study of structural defects in Ga2-xFexO3 thin layers
- 2016Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
- 2013Room temperature multiferroicity in Ga0.6Fe1.4O3:Mg thin filmscitations
- 2012Effects of iron concentration and cationic site disorder on the optical properties of magnetoelectric gallium ferrite thin filmscitations
Places of action
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article
Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
Abstract
The cationic distribution is decisive for both the magnetic and electric properties of complex oxides. While it can be easily determined in bulk materials using classical methods such as X-ray or neutron diffraction, difficulties arise for thin films owing to the relatively small amount of material to probe. It is shown here that a full determination of the cationic site distribution in thin films is possible through an optimized processing of resonant elastic X-ray scattering experiments. The method is illustrated using gallium ferrite Ga 2-x Fe x O 3 samples which have been the focus of an increasing number of studies this past decade. They indeed represent an alternative to the, to date, only room-temperature magnetoelectric compound BiFeO 3. The methodology can be applied to determine the element distribution over the various crystallographic sites in any crystallized system.