| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Boudet, Nathalie
Processes and Engineering in Mechanics and Materials
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (24/24 displayed)
- 2023Influence of the Ge content on the lithiation process of crystalline Si 1− x Ge x nanoparticle-based anodes for Li-ion batteriescitations
- 2022Relationship between atomic structure and excellent glass forming ability in Pd 42.5 Ni 7.5 Cu 30 P 20 metallic glasscitations
- 2022Coupling between elastic strains and phase transition in dense pure zirconia polycrystalscitations
- 2022Relationship between atomic structure and excellent glass forming ability in Pd42.5Ni7.5Cu30P20 metallic glasscitations
- 2021Detailed structural analysis of amorphous Pd40Cu40P20: Comparison with the metallic glass Pd40Ni40P20 from the viewpoint of glass forming abilitycitations
- 2021Detailed structural analysis of amorphous Pd 40 Cu 40 P 20 :Comparison with the metallic glass Pd 40 Ni 40 P 20 from the viewpoint of glass forming abilitycitations
- 2020Prelithiation of silicon/graphite composite anodes: Benefits and mechanisms for long-lasting Li-Ion batteriescitations
- 2019Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facilitycitations
- 2019Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facilitycitations
- 2019Heterogeneous Nanostructural Aging of Fuel Cell Ionomer Revealed by Operando SAXScitations
- 2019Partial structure investigation of the traditional bulk metallic glass Pd40Ni40P20citations
- 2019Partial structure investigation of the traditional bulk metallic glass Pd40Ni40 P20citations
- 2018In situ Synchrotron X-Ray diffraction study of high-temperature stress relaxation in chromia scales containing the reactive element yttriumcitations
- 2017Strains in thermally growing Cr2O3 films measured in situ using synchrotron X-rayscitations
- 2016Tuning the conductivity type in a room temperature magnetic oxide: Ni-doped Ga0.6Fe1.4O3 thin filmscitations
- 2016Reaction of Ni film with In0.53Ga0.47As: Phase formation and texturecitations
- 2016Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
- 2016Self-organized arrays of dislocations in thin smectic liquid crystal filmscitations
- 2016Self-organized arrays of dislocations in thin smectic liquid crystal filmscitations
- 2014Probing Self-Assembly of Cylindrical Morphology Block Copolymer Using in Situ and ex Situ Grazing Incidence Small-Angle X-ray Scattering: The Attractive Case of Graphoepitaxycitations
- 2012Key experimental information on intermediate-range atomic structures in amorphous Ge2Sb2Te5 phase change materialcitations
- 2012Anomalous x-ray diffraction measurements of long-range order in (001)-textured L1(0) FePtCu thin filmscitations
- 2011Microstructural mapping of C60 phase transformation into disordered graphite at high pressure, using X-ray diffraction microtomographycitations
- 2007Development of structural order during supercooling of a fragile oxide meltcitations
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article
Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
Abstract
The cationic distribution is decisive for both the magnetic and electric properties of complex oxides. While it can be easily determined in bulk materials using classical methods such as X-ray or neutron diffraction, difficulties arise for thin films owing to the relatively small amount of material to probe. It is shown here that a full determination of the cationic site distribution in thin films is possible through an optimized processing of resonant elastic X-ray scattering experiments. The method is illustrated using gallium ferrite Ga 2-x Fe x O 3 samples which have been the focus of an increasing number of studies this past decade. They indeed represent an alternative to the, to date, only room-temperature magnetoelectric compound BiFeO 3. The methodology can be applied to determine the element distribution over the various crystallographic sites in any crystallized system.