| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Joly, Yves
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (16/16 displayed)
- 2022Charge Reorganization at the Adsorbate Covered Electrode Surface Probed through in Situ Resonant X-ray Diffraction Combined with ab Initio Modelingcitations
- 2022Charge reorganization at the adsorbate covered electrode surface probed through in-situ resonant x-ray diffraction combined with ab initio modellingcitations
- 2022In situ resonant x-ray scattering at the French “CRG-IF” beamline at ESRF
- 2022In situ resonant x-ray scattering at the French “CRG-IF” beamline at ESRF
- 2020Static magnetic proximity effects and spin Hall magnetoresistance in Pt/Y3Fe5O12 and inverted Y3Fe5O12/Pt bilayerscitations
- 2020Magnetic field induced structural changes in magnetite observed by resonant x-ray diffraction and Mössbauer spectroscopycitations
- 2020Static magnetic proximity effects and spin Hall magnetoresistance in Pt/Y$_{3}$Fe$_{5}$O$_{12}$ and inverted Y$_{3}$Fe$_{5}$O$_{12}$/Pt bilayerscitations
- 2019Epitaxial growth and structure of cobalt ferrite thin films with large inversion parameter on Ag(001)citations
- 2019Epitaxial growth and structure of cobalt ferrite thin films with large inversion parameter on Ag(001)citations
- 2017Temperature Variation of Magnetic Anisotropy in Pt / Co / AlO x Trilayerscitations
- 2016Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
- 2015Core–shell-like Au sub-nanometer clusters in Er-implanted silicacitations
- 2012X-ray resonant magnetic reflectivity of stratified magnetic structures: Eigenwave formalism and application to a W/Fe/W trilayercitations
- 2012Stability of the local Ni site distortions across pressure-induced metallization in YNiO3citations
- 2007EXAFS studies of the local atomic structure of the lead-free piezoelectric ceramics KxNa1 xNbO3 over the temperature range 10-1023 Kcitations
- 2007Phase transitions in lead-free piezoelectric ceramics: Study of local atomic structurecitations
Places of action
| Organizations | Location | People |
|---|
article
Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information
Abstract
The cationic distribution is decisive for both the magnetic and electric properties of complex oxides. While it can be easily determined in bulk materials using classical methods such as X-ray or neutron diffraction, difficulties arise for thin films owing to the relatively small amount of material to probe. It is shown here that a full determination of the cationic site distribution in thin films is possible through an optimized processing of resonant elastic X-ray scattering experiments. The method is illustrated using gallium ferrite Ga 2-x Fe x O 3 samples which have been the focus of an increasing number of studies this past decade. They indeed represent an alternative to the, to date, only room-temperature magnetoelectric compound BiFeO 3. The methodology can be applied to determine the element distribution over the various crystallographic sites in any crystallized system.