• Rohel, Tony
• Rodriguez, Jean-Baptiste
• Turban, Pascal
• Létoublon, Antoine
• Tavernier, Karine
• Lucci, Ida
• Cerutti, Laurent
• Tournié, Eric
• Chen, Lipin
• Largeau, Ludovic
• Léger, Yoan
• Patriarche, Gilles J.
• Charbonnier, Simon
• Ponchet, Anne
• Bernard, Rozenn
• Alvarez, Angela
• Bahri, Mounib
• Bertru, Nicolas
• Cornet, Charles

Abstract

Here we clarify the central role of the miscut during group III-V/group IV crystal growth. We show that the miscut impacts the initial antiphase domain distribution, with two distinct nucleation-driven (miscut typically >1°) and terraces-driven (miscut typically <0.1°) regimes. It is then inferred how the antiphase domain distribution mean phase and mean lateral length are affected by the miscut. An experimental confirmation is given through the comparison of antiphase domain distributions in GaP and GaSb/AlSb samples grown on nominal and vicinal Si substrates. The antiphase domain burying step of GaP/Si samples is then observed at the atomic scale by scanning tunneling microscopy. The steps arising from the miscut allow growth rate imbalance between the two phases of the crystal and the growth conditions can deeply modify the imbalance coefficient, as illustrated with GaAs/Si. We finally explain how a monodomain III-V semiconductor configuration can be achieved even on low miscut substrates.

Topics

• impedance spectroscopy
• phase
• zinc
• scanning tunneling microscopy
• III-V semiconductor