Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Allen, L. J.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2022A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation14citations
  • 2021Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value10citations
  • 2020A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy datacitations
  • 2016Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy11citations
  • 2016Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy57citations
  • 2003Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron Microscopy100citations

Places of action

Chart of shared publication
Zhang, Z.
2 / 62 shared
Koch, C. T.
2 / 4 shared
Sheridan, E.
2 / 2 shared
Griffin, S. M.
2 / 2 shared
Inzani, K.
2 / 2 shared
Scott, M. C.
2 / 12 shared
Ophus, C.
3 / 16 shared
Findlay, S. D.
3 / 4 shared
Ramesh, R.
2 / 28 shared
Pekin, T. C.
2 / 6 shared
Brown, H. G.
3 / 6 shared
Pelz, Philipp
3 / 25 shared
Schloz, M.
2 / 3 shared
Hsu, S.-L.
2 / 2 shared
Ciston, J.
3 / 7 shared
Lebeau, J. M.
2 / 2 shared
Dalfonso, A. J.
2 / 2 shared
Dycus, J. H.
2 / 2 shared
Xu, W.
2 / 33 shared
Sang, X.
2 / 2 shared
Chen, Z.
2 / 49 shared
Pennycook, S. J.
1 / 10 shared
Lupini, A. R.
1 / 3 shared
Oxley, M. P.
1 / 3 shared
Chart of publication period
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Co-Authors (by relevance)

  • Zhang, Z.
  • Koch, C. T.
  • Sheridan, E.
  • Griffin, S. M.
  • Inzani, K.
  • Scott, M. C.
  • Ophus, C.
  • Findlay, S. D.
  • Ramesh, R.
  • Pekin, T. C.
  • Brown, H. G.
  • Pelz, Philipp
  • Schloz, M.
  • Hsu, S.-L.
  • Ciston, J.
  • Lebeau, J. M.
  • Dalfonso, A. J.
  • Dycus, J. H.
  • Xu, W.
  • Sang, X.
  • Chen, Z.
  • Pennycook, S. J.
  • Lupini, A. R.
  • Oxley, M. P.
OrganizationsLocationPeople

article

Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron Microscopy

  • Allen, L. J.
  • Pennycook, S. J.
  • Lupini, A. R.
  • Oxley, M. P.
Abstract

<p>The “delocalization” of inelastic scattering is an important issue for the ultimate spatial resolution of innershell spectroscopy in the electron microscope. It is demonstrated in a nonlocal model for electron energy loss spectroscopy (EELS) that delocalization of scanning transmission electron microscopy (STEM) images for single, isolated atoms is primarily determined by the width of the probe, even for light atoms. We present experimental data and theoretical simulations for Ti [Formula presented]-shell EELS in a [100] [Formula presented] crystal showing that, in this case, delocalization is not significantly increased by dynamical propagation. Issues relating to the use of aberration correctors in the STEM geometry are discussed.</p>

Topics
  • impedance spectroscopy
  • simulation
  • transmission electron microscopy
  • electron energy loss spectroscopy