Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2013Modeling Self-Organization of Thin Strained Metallic Overlayers from Atomic to Micron Scales12citations

Places of action

Chart of shared publication
Ala-Nissila, Tapio
1 / 27 shared
Kanerva, P.
1 / 2 shared
Ying, S-C.
1 / 2 shared
Rossi, G.
1 / 37 shared
Achim, C. V.
1 / 4 shared
Granato, E.
1 / 2 shared
Sanches, F.
1 / 2 shared
Chart of publication period
2013

Co-Authors (by relevance)

  • Ala-Nissila, Tapio
  • Kanerva, P.
  • Ying, S-C.
  • Rossi, G.
  • Achim, C. V.
  • Granato, E.
  • Sanches, F.
OrganizationsLocationPeople

article

Modeling Self-Organization of Thin Strained Metallic Overlayers from Atomic to Micron Scales

  • Elder, Ken
  • Ala-Nissila, Tapio
  • Kanerva, P.
  • Ying, S-C.
  • Rossi, G.
  • Achim, C. V.
  • Granato, E.
  • Sanches, F.
Abstract

A computational study of the self-organization of heteroepitaxial ultrathin metal films is presented. By means of a continuum complex field model, the relationship of the equilibrium surface patterns of the film to the adsorbate-substrate adhesion energy, as well as to the mismatch between the adsorbate and the substrate bulk lattice parameters, are obtained in both the tensile and the compressive regimes. Our approach captures pattern periodicities over large length scales, up to several hundreds of nm, retaining atomistic resolution. Thus, the results can be directly compared with experimental data, in particular for systems such as Cu/Ru(0001) and Ag/Cu(111). Three nontrivial, stable superstructures for the overlayer, namely, stripe, honeycomb, and triangular, are identified that closely resemble those observed experimentally. Simulations in nonequilibrium conditions are performed as well to identify metastable structural configurations and the dynamics of ordering of the overlayer.

Topics
  • impedance spectroscopy
  • surface
  • simulation