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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Ali, M. A. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Dalfonso, Adrian
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (7/7 displayed)
- 2010Elemental mapping in scanning transmission electron microscopycitations
- 2009Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy imagescitations
- 2008Depth sectioning using electron energy loss spectroscopycitations
- 2008Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scatteringcitations
- 2008Volcano structure in atomic resolution core-loss imagescitations
- 2007Interpreting atomic-resolution spectroscopic imagescitations
- 2007Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopycitations
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article
Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images
Abstract
Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.