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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Stemmer, Susanne
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Topics
Publications (6/6 displayed)
- 2016Dichotomy of the transport coefficients of correlated electron liquids in SrTiO3
- 2016Key role of lattice symmetry in the metal-insulator transition of NdNiO3 filmscitations
- 2016Carrier density independent scattering rate in SrTiO3-based electron liquidscitations
- 2015Tailoring resistive switching in Pt/SrTiO3 junctions by stoichiometry controlcitations
- 2010Elemental mapping in scanning transmission electron microscopycitations
- 2009Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy imagescitations
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article
Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images
Abstract
Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.