Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Kucheyev, S. O.

  • Google
  • 18
  • 37
  • 1144

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (18/18 displayed)

  • 2007Energetic Processing of Interstellar Silicate Grains by Cosmic Rays81citations
  • 2005Ion irradiation-induced disordering of semiconductors5citations
  • 2004Ion-beam-defect processes in group-III nitrides and ZnO46citations
  • 2004Dynamic annealing in III-nitrides under ion bombardment54citations
  • 2004Lattice damage produced in GaN by swift heavy ions83citations
  • 2003Ion-beam-produced structural defects in ZnO254citations
  • 2002Electrical isolation of ZnO by ion bombardment65citations
  • 2002Ion-beam-produced damage and its stability in AlN films64citations
  • 2002Structural disorder in ion-implanted AlxGa1-xN40citations
  • 2001Effect of ion species on the accumulation of ion-beam damage in GaNcitations
  • 2001Electrical isolation of GaN by MeV ion irradiation50citations
  • 2001The effects of ion mass, energy, dose, flux and irradiation temperature on implantation disorder in GaN39citations
  • 2001Disordering and anomalous surface erosion of GaN during ion bombardment at elevated temperatures32citations
  • 2000Ion-beam-induced porosity of GaN69citations
  • 2000Polycrystallization and surface erosion of amorphous GaN during elevated temperature ion bombardment15citations
  • 2000Ion-beam-induced dissociation and bubble formation in GaN72citations
  • 2000Damage buildup in GaN under ion bombardment175citations
  • 2000Surface disordering and nitrogen loss in GaN under ion bombardmentcitations

Places of action

Chart of shared publication
Felter, T. E.
1 / 1 shared
Van Breugel, W.
1 / 1 shared
Baragiola, R. A.
1 / 1 shared
Loeffler, M. J.
1 / 1 shared
Bradley, J. P.
1 / 4 shared
Bajt, S.
1 / 3 shared
Graham, G.
1 / 2 shared
Torres, Diego F.
1 / 1 shared
Dai, Z. R.
1 / 1 shared
Dukes, C. A.
1 / 1 shared
Bringa, E. M.
1 / 4 shared
Tielens, A. G. G. M.
1 / 16 shared
Williams, J. S.
17 / 39 shared
Zou, J.
10 / 17 shared
Li, G.
11 / 31 shared
Timmers, H.
1 / 2 shared
Hamza, A. V.
1 / 4 shared
Evans, Cheryl
1 / 1 shared
Nelson, A. J.
1 / 2 shared
Inoue, Masataka
1 / 1 shared
Ogata, Ken Ichi
1 / 1 shared
Koike, Kazuto
1 / 2 shared
Deenapanray, P. N. K.
1 / 7 shared
Sasa, Shigehiko
1 / 1 shared
Yano, Mitsuaki
1 / 2 shared
Guo, S.
2 / 11 shared
Ferguson, I. T.
2 / 6 shared
Manasreh, M. O.
2 / 13 shared
Pophristic, M.
2 / 4 shared
Zou, Jin
3 / 26 shared
Jagadish, C.
3 / 23 shared
Titov, A. I.
1 / 3 shared
Boudinov, H.
1 / 3 shared
Tan, H. H.
1 / 6 shared
Phillips, M. R.
1 / 3 shared
Pearton, S. J.
1 / 3 shared
Toth, M.
1 / 3 shared
Chart of publication period
2007
2005
2004
2003
2002
2001
2000

Co-Authors (by relevance)

  • Felter, T. E.
  • Van Breugel, W.
  • Baragiola, R. A.
  • Loeffler, M. J.
  • Bradley, J. P.
  • Bajt, S.
  • Graham, G.
  • Torres, Diego F.
  • Dai, Z. R.
  • Dukes, C. A.
  • Bringa, E. M.
  • Tielens, A. G. G. M.
  • Williams, J. S.
  • Zou, J.
  • Li, G.
  • Timmers, H.
  • Hamza, A. V.
  • Evans, Cheryl
  • Nelson, A. J.
  • Inoue, Masataka
  • Ogata, Ken Ichi
  • Koike, Kazuto
  • Deenapanray, P. N. K.
  • Sasa, Shigehiko
  • Yano, Mitsuaki
  • Guo, S.
  • Ferguson, I. T.
  • Manasreh, M. O.
  • Pophristic, M.
  • Zou, Jin
  • Jagadish, C.
  • Titov, A. I.
  • Boudinov, H.
  • Tan, H. H.
  • Phillips, M. R.
  • Pearton, S. J.
  • Toth, M.
OrganizationsLocationPeople

article

Ion-beam-produced structural defects in ZnO

  • Kucheyev, S. O.
  • Hamza, A. V.
  • Williams, J. S.
  • Zou, J.
  • Evans, Cheryl
  • Nelson, A. J.
Abstract

<p>We study the evolution of lattice defects in single-crystal ZnO bombarded with 60-keV (formula presented) and 300-keV (formula presented) ions at 77 and 300 K. To characterize ion-beam-produced structural defects, we use a combination of Rutherford backscattering/channeling (RBS/C) spectrometry, cross-sectional transmission electron microscopy (XTEM), x-ray photoelectron spectroscopy, and atomic force microscopy. Results show that ZnO exhibits strong dynamic annealing, and even high-dose bombardment with heavy (formula presented) ions at 77 K does not render ZnO amorphous. However, a crystalline-to-amorphous phase transition can be induced by irradiation with relatively light (formula presented) ions. In this latter case, amorphization is attributed to strong chemical effects of Si atoms implanted into the ZnO lattice, resulting in the stabilization of an amorphous phase. High-dose heavy-ion bombardment also results in a strong stoichiometric imbalance (loss of O) in the near-surface region. A variation in irradiation temperature from 77 up to 300 K has a minor effect on the damage buildup behavior in ZnO bombarded with Au ions. Data analysis also shows that a variation in the density of collision cascades by increasing ion mass from (formula presented) up to (formula presented) has a negligible effect on the damage buildup behavior. For both light- (formula presented) and heavy- (formula presented) ion bombardment regimes, XTEM reveals that ion irradiation produces energetically favorable planar defects which are parallel to the basal plane of the wurtzite structure of ZnO. Interestingly, our RBS/C study also reveals the formation of a middle defect peak between the surface and bulk peaks of disorder in Au-implanted ZnO, but not in Si-bombarded samples. The formation of this middle peak, most likely to be related to complex defect agglomeration processes, is rather unexpected and, to our knowledge, has not been observed in any other material. Physical mechanisms of defect formation in ZnO under ion bombardment are discussed based on these experimental findings.</p>

Topics
  • density
  • impedance spectroscopy
  • surface
  • amorphous
  • phase
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • phase transition
  • transmission electron microscopy
  • defect
  • annealing
  • spectrometry
  • Rutherford backscattering spectrometry