Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Kerssemakers, J. W. J.

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in Cooperation with on an Cooperation-Score of 37%

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Publications (1/1 displayed)

  • 2002Hysteresis in YHx films observed with in situ measurements26citations

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Griessen, R.
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Molen, S. J. Van Der
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Kooij, Ernst Stefan
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Remhof, A.
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2002

Co-Authors (by relevance)

  • Griessen, R.
  • Molen, S. J. Van Der
  • Kooij, Ernst Stefan
  • Remhof, A.
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article

Hysteresis in YHx films observed with in situ measurements

  • Griessen, R.
  • Molen, S. J. Van Der
  • Kerssemakers, J. W. J.
  • Kooij, Ernst Stefan
  • Remhof, A.
Abstract

Giant hysteretic effects in the YHx hydrogen switchable mirror system are observed between x=1.9 and x=3 in pressure composition isotherms, optical and electrical properties, and mechanical stress. Polycrystalline Y films are studied by simultaneous in situ measurements of electrical resistivity, optical transmittance and x-ray diffractometry. These experiments are linked to optical microscopy of the samples. During hydrogen loading above x=1.9 the films stay in the metallic fcc phase until the optical transmittance reaches its minimum and the electrical resistance curve exhibits a characteristic feature at x=2.1. Upon further loading the system crosses the miscibility gap in which the fcc phase coexists with the hcp phase before hydrogen saturation is reached in the pure hcp phase. While the fcc phase stays at a concentration of x=2.1 in the coexistence region during loading, it remains at a concentration of x=1.9 during unloading. The hysteretic effects observed in optical transmission and electrical resistivity result from the different properties of the low concentration fcc phase YH1.9 and the high concentration fcc phase YH2.1. They can be explained on the basis of the bulk phase diagram if the different stress states during loading and unloading are taken into account. These results contradict earlier interpretations of the hysteresis in thin film YHx, based on nonsimultaneous measurements of the optical and structural properties on different films.

Topics
  • impedance spectroscopy
  • resistivity
  • phase
  • experiment
  • thin film
  • Hydrogen
  • optical microscopy
  • phase diagram