Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2019Low-Temperature Properties of Whispering-Gallery Modes in Isotopically Pure Silicon-284citations

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Chart of shared publication
Tobar, Michael
1 / 14 shared
Johnson, B. C.
1 / 5 shared
Bourhill, Jeremy
1 / 6 shared
Creedon, D. L.
1 / 2 shared
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2019

Co-Authors (by relevance)

  • Tobar, Michael
  • Johnson, B. C.
  • Bourhill, Jeremy
  • Creedon, D. L.
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article

Low-Temperature Properties of Whispering-Gallery Modes in Isotopically Pure Silicon-28

  • Tobar, Michael
  • Jamieson, D. N.
  • Johnson, B. C.
  • Bourhill, Jeremy
  • Creedon, D. L.
Abstract

<p>Whispering-gallery-(WG) mode resonators are machined from a boule of single-crystal isotopically pure silicon-28. Before machining, the as-grown rod is measured in a cavity, with the best Bragg confined modes exhibiting microwave Q factors on the order of a million for frequencies between 10 and 15 GHz. After machining the rod into smaller cylindrical WG-mode resonators, the frequencies of the fundamental mode families are used to determine the relative permittivity of the material to be 11.488±0.024 near 4 K, with the precision limited only by the dimensional accuracy of the resonator. However, the machining degraded the Q factors to below 4×104. Raman spectroscopy is used to optimize postmachining surface treatments to restore high-Q-factors. This is an enabling step for the use of such resonators for hybrid quantum systems and frequency-conversion applications, as silicon-28 also has very low phonon losses, can host very narrow linewidth spin ensembles, and is a material commonly used in optical applications.</p>

Topics
  • impedance spectroscopy
  • surface
  • dielectric constant
  • Silicon
  • Raman spectroscopy