Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2020Elucidating the capability of electron backscattering for 3D nano-structure determination2citations
  • 2020The effect of ion implantation on reflection electron energy loss spectroscopy2citations
  • 2019Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling1citations
  • 2018The influence of shallow core levels on the shape of REELS spectra7citations
  • 2015Neutralization and wake effects on the Coulomb explosion of swift H2+ ions traversing thin films7citations
  • 2014The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx films15citations

Places of action

Chart of shared publication
Vos, Maarten
6 / 18 shared
Trombini, H.
3 / 3 shared
Reboh, S.
1 / 6 shared
Selau, F. F.
2 / 2 shared
Tee, B. P. E.
1 / 1 shared
Marmitt, G. G.
2 / 2 shared
Andrade, A. M. H. De
1 / 1 shared
Sulzbach, M. C.
1 / 1 shared
Pereira, L. G.
1 / 1 shared
Marmitt, G.
1 / 1 shared
Fadanelli, R. C.
1 / 1 shared
Rosa, L. F. S.
1 / 1 shared
Dias, J. F.
1 / 3 shared
Venkatachalam, D. K.
1 / 5 shared
Liu, X.
1 / 54 shared
Nandi, Sanjoy
1 / 7 shared
Chart of publication period
2020
2019
2018
2015
2014

Co-Authors (by relevance)

  • Vos, Maarten
  • Trombini, H.
  • Reboh, S.
  • Selau, F. F.
  • Tee, B. P. E.
  • Marmitt, G. G.
  • Andrade, A. M. H. De
  • Sulzbach, M. C.
  • Pereira, L. G.
  • Marmitt, G.
  • Fadanelli, R. C.
  • Rosa, L. F. S.
  • Dias, J. F.
  • Venkatachalam, D. K.
  • Liu, X.
  • Nandi, Sanjoy
OrganizationsLocationPeople

article

Neutralization and wake effects on the Coulomb explosion of swift H2+ ions traversing thin films

  • Vos, Maarten
  • Fadanelli, R. C.
  • Rosa, L. F. S.
  • Dias, J. F.
  • Grande, P. L.
Abstract

<p>The Coulomb explosion of small cluster beams can be used to measure the dwell time of fragments traversing amorphous films. Therefore, the thickness of thin films can be obtained with the so-called Coulomb depth profiling technique using relatively high cluster energies where the fragments are fully ionized after breakup. Here we demonstrate the applicability of Coulomb depth profiling technique at lower cluster energies where neutralization and wake effects come into play. To that end, we investigated 50-200 keV/u H<sub>2</sub><sup>+</sup> molecular ions impinging on a 10 nm TiO<sub>2</sub> film and measured the energy of the backscattered H<sup>+</sup> fragments with high-energy resolution. The effect of the neutralization of the H<sup>+</sup> fragments along the incoming trajectory before the backscattering collision is clearly observed at lower energies through the decrease of the energy broadening due to the Coulomb explosion. The reduced values of the Coulomb explosion combined with full Monte Carlo simulations provide compatible results with those obtained at higher cluster energies where neutralization is less important. The results are corroborated by electron microscopy measurements.</p>

Topics
  • impedance spectroscopy
  • cluster
  • amorphous
  • thin film
  • simulation
  • laser emission spectroscopy
  • electron microscopy