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| Naji, M. |
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| Motta, Antonella |
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| Ali, M. A. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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Rupp, Anna
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article
Imaging lattice reconstruction in homobilayers and heterobilayers of transition metal dichalcogenides
Abstract
<jats:title>Abstract</jats:title><jats:p>Moiré interference effects influence profoundly the optoelectronic properties of vertical van der Waals structures. Here we systematically establish secondary electron imaging in a scanning electron microscope as a powerful technique for visualizing reconstruction of moiré lattices into registry-contrasting domains in vertical homobilayers and heteorbilayers of transition metal dichalcogenides (TMDs) with parallel and antiparallel alignment. With optimal parameters for contrast-maximizing imaging of high-symmetry registries, we identify distinct crystal realizations of WSe<jats:sub>2</jats:sub> homobilayers and MoSe<jats:sub>2</jats:sub>–WSe<jats:sub>2</jats:sub> heterostructures synthesized by chemical vapor deposition. In particular, we find evidence for a mutually exclusive competition between <jats:inline-formula><jats:tex-math><?CDATA $R_h^X$?></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"><mml:msubsup><mml:mi>R</mml:mi><mml:mi>h</mml:mi><mml:mi>X</mml:mi></mml:msubsup></mml:math><jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="tdmacf5fbieqn1.gif" xlink:type="simple" /></jats:inline-formula> and <jats:inline-formula><jats:tex-math><?CDATA $R_h^M$?></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"><mml:msubsup><mml:mi>R</mml:mi><mml:mi>h</mml:mi><mml:mi>M</mml:mi></mml:msubsup></mml:math><jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="tdmacf5fbieqn2.gif" xlink:type="simple" /></jats:inline-formula> registries, manifesting in complete reconstruction of bilayer crystals into one distinct registry or alternating large-area domains in <jats:inline-formula><jats:tex-math><?CDATA $R_h^X$?></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"><mml:msubsup><mml:mi>R</mml:mi><mml:mi>h</mml:mi><mml:mi>X</mml:mi></mml:msubsup></mml:math><jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="tdmacf5fbieqn3.gif" xlink:type="simple" /></jats:inline-formula> and <jats:inline-formula><jats:tex-math><?CDATA $R_h^M$?></jats:tex-math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"><mml:msubsup><mml:mi>R</mml:mi><mml:mi>h</mml:mi><mml:mi>M</mml:mi></mml:msubsup></mml:math><jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="tdmacf5fbieqn4.gif" xlink:type="simple" /></jats:inline-formula> stacking. Our results have immediate implications for the optical properties of registry-specific excitons in layered stacks of TMDs, and demonstrate the general potential of secondary electron imaging for van der Waals twistronics.</jats:p>