Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2023Tuned Reactivity at the Lithium Metal–Argyrodite Solid State Electrolyte Interphase31citations
  • 2017ultrathin wafer scale hexagonal boron nitride on dielectric surfaces by diffusion and segregation mechanism33citations
  • 2016The eyes of Tullimonstrum reveal a vertebrate affinity55citations
  • 2015Revealing the planar chemistry of two-dimensional heterostructures at the atomic level72citations
  • 2015Chemical, experimental, and morphological evidence for diagenetically altered melanin in exceptionally preserved fossils104citations

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Chart of shared publication
Mitlin, David
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Hao, Hongchang
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Siegel, Donald J.
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Liu, Yijie
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Mukherjee, Partha P.
1 / 6 shared
Watt, John
1 / 9 shared
Greene, Samuel M.
1 / 1 shared
Wang, Yixian
1 / 5 shared
Tsai, Wanyu
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Celio, Hugo
1 / 3 shared
Fang, Ruyi
1 / 2 shared
Naik, Kaustubh G.
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Yang, Guang
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Vishnugopi, Bairav S.
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Banerjee, Sanjay K.
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Sonde, Sushant Sudam
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Colombo, Luigi
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Tutuc, Emanuel
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Corbet, Chris M.
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Lu, Ning
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Kim, Moon J.
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Purnell, Mark A.
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Clements, Thomas
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Vinther, Jakob
2 / 2 shared
Martin, Peter George
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Gabbott, Sarah E.
2 / 2 shared
Ruoff, Rodney S.
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Chou, Harry
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Ghosh, Rudresh
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Rabenstein, Renate
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Habersetzer, Jörg
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Schaal, Stephan
1 / 1 shared
Feseha, Mulugeta
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Gardner, James
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Singh, Suresh
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Colleary, Caitlin
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Wuttke, Michael
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Sylvestersen, Rene Lyng
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Jacobs, Louis L.
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Clemens, Matthew
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Currano, Ellen D.
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Jacobs, Bonnie F.
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Chart of publication period
2023
2017
2016
2015

Co-Authors (by relevance)

  • Mitlin, David
  • Hao, Hongchang
  • Siegel, Donald J.
  • Liu, Yijie
  • Mukherjee, Partha P.
  • Watt, John
  • Greene, Samuel M.
  • Wang, Yixian
  • Tsai, Wanyu
  • Celio, Hugo
  • Fang, Ruyi
  • Naik, Kaustubh G.
  • Yang, Guang
  • Vishnugopi, Bairav S.
  • Banerjee, Sanjay K.
  • Sonde, Sushant Sudam
  • Colombo, Luigi
  • Tutuc, Emanuel
  • Corbet, Chris M.
  • Lu, Ning
  • Kim, Moon J.
  • Purnell, Mark A.
  • Clements, Thomas
  • Vinther, Jakob
  • Martin, Peter George
  • Gabbott, Sarah E.
  • Ruoff, Rodney S.
  • Chou, Harry
  • Ghosh, Rudresh
  • Rabenstein, Renate
  • Habersetzer, Jörg
  • Schaal, Stephan
  • Feseha, Mulugeta
  • Gardner, James
  • Singh, Suresh
  • Colleary, Caitlin
  • Wuttke, Michael
  • Sylvestersen, Rene Lyng
  • Jacobs, Louis L.
  • Clemens, Matthew
  • Currano, Ellen D.
  • Jacobs, Bonnie F.
OrganizationsLocationPeople

article

ultrathin wafer scale hexagonal boron nitride on dielectric surfaces by diffusion and segregation mechanism

  • Banerjee, Sanjay K.
  • Dolocan, Andrei
  • Sonde, Sushant Sudam
  • Colombo, Luigi
  • Tutuc, Emanuel
  • Corbet, Chris M.
  • Lu, Ning
  • Kim, Moon J.
Abstract

Chemical vapor deposition (CVD) of two-dimensional (2D) hexagonal boron nitride (h-BN) is at the center of numerous studies for its applications in novel electronic devices. However, a clear understanding of the growth mechanism is lacking for its wider industrial adoption on technologically relevant substrates such as SiO2. Here, we demonstrate a controllable growth method of thin, wafer scale h-BN films on arbitrary substrates. We also clarify the growth mechanism to be diffusion and surface segregation (D-SS) of boron (B) and nitrogen (N) in Ni and Co thin films on SiO2/Si substrates after exposure to diborane and ammonia precursors at high temperature. The segregation was found to be independent of the cooling rates employed in this report, and to our knowledge has not been found nor reported for 2D h-BN growth so far, and thus provides an important direction for controlled growth of h-BN. This unique segregation behavior is a result of a combined effect of high diffusivity, small film thickness and the inability to achieve extremely high cooling rates in CVD systems. The resulting D-SS h-BN films exhibit excellent electrical insulating behavior with an optical bandgap of about 5.8?eV. Moreover, graphene-on-h-BN field effect transistors using the as-grown D-SS h-BN films show a mobility of about 6000?cm2 V?1 s?1 at room temperature.

Topics
  • impedance spectroscopy
  • surface
  • mobility
  • thin film
  • Nitrogen
  • nitride
  • Boron
  • two-dimensional
  • diffusivity
  • chemical vapor deposition