Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2022Flexible X-ray imaging detectors using scintillating fibers4citations

Places of action

Chart of shared publication
Angelmahr, M.
1 / 4 shared
Wilbur, S.
1 / 1 shared
Koch, J.
1 / 5 shared
Anastopoulos, C.
1 / 1 shared
Asfis, G.
1 / 1 shared
Lindblom, M.
1 / 1 shared
Margulis, W.
1 / 1 shared
Chart of publication period
2022

Co-Authors (by relevance)

  • Angelmahr, M.
  • Wilbur, S.
  • Koch, J.
  • Anastopoulos, C.
  • Asfis, G.
  • Lindblom, M.
  • Margulis, W.
OrganizationsLocationPeople

article

Flexible X-ray imaging detectors using scintillating fibers

  • Angelmahr, M.
  • Wilbur, S.
  • Koch, J.
  • Anastopoulos, C.
  • Asfis, G.
  • Lindblom, M.
  • Lohwasser, K.
  • Margulis, W.
Abstract

<jats:title>Abstract</jats:title><jats:p>We present early design and simulation work on a novel X-ray imaging detector. The intent of the FleX-RAY project is to create a digital X-ray detector that is capable of producing high-resolution images, is flexible enough to produce an image on a curved surface, and is capable of self-reporting its final shape. The X-rays will be detected on a sheet of scintillating optical fibers, which will guide the scintillation light to single-photon avalanche photodiodes. This setup allows the electronics and hardware to be moved out of the path of the X-ray beam, limiting the need for additional shielding. Self-shape-reporting will be achieved using a flexible ultra-thin glass substrate with optical waveguides and Bragg gratings, processed by femtosecond laser point-by-point writing. The functionalized glass substrate allows precise measurement of strains, which can be used to calculate the shape.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • simulation
  • glass
  • glass