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Allen, Leslie
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Topics
Publications (9/9 displayed)
- 2010Elemental mapping in scanning transmission electron microscopycitations
- 2009Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy imagescitations
- 2009Theory of dynamical scattering in near-edge electron energy loss spectroscopycitations
- 2008Depth sectioning using electron energy loss spectroscopycitations
- 2008Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scatteringcitations
- 2008Volcano structure in atomic resolution core-loss imagescitations
- 2007Interpreting atomic-resolution spectroscopic imagescitations
- 2007Imaging using inelastically scattered electrons in CTEM and STEM geometrycitations
- 2007Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopycitations
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document
Elemental mapping in scanning transmission electron microscopy
Abstract
We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the thesis that such maps are always likely to be directly interpretable. This can be explained in terms of the local nature of the effective optical potential for ionization under those imaging conditions.