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Stemmer, Susanne
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Publications (6/6 displayed)
- 2016Dichotomy of the transport coefficients of correlated electron liquids in SrTiO3
- 2016Key role of lattice symmetry in the metal-insulator transition of NdNiO3 filmscitations
- 2016Carrier density independent scattering rate in SrTiO3-based electron liquidscitations
- 2015Tailoring resistive switching in Pt/SrTiO3 junctions by stoichiometry controlcitations
- 2010Elemental mapping in scanning transmission electron microscopycitations
- 2009Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy imagescitations
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document
Elemental mapping in scanning transmission electron microscopy
Abstract
We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the thesis that such maps are always likely to be directly interpretable. This can be explained in terms of the local nature of the effective optical potential for ionization under those imaging conditions.