Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2022Differential Cross-section Measurements for Deuteron Elastic Scattering on <sup>11</sup>Bcitations

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Krmpotić, M.
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Lagoyannis, A.
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Maragkos, F.
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Ziagkova, A.
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Kokkoris, M.
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Tsakiris, Th
1 / 1 shared
Cosic, D.
1 / 1 shared
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2022

Co-Authors (by relevance)

  • Krmpotić, M.
  • Lagoyannis, A.
  • Maragkos, F.
  • Ziagkova, A.
  • Kokkoris, M.
  • Tsakiris, Th
  • Cosic, D.
OrganizationsLocationPeople

article

Differential Cross-section Measurements for Deuteron Elastic Scattering on <sup>11</sup>B

  • Krmpotić, M.
  • Lagoyannis, A.
  • Maragkos, F.
  • Provatas, G.
  • Ziagkova, A.
  • Kokkoris, M.
  • Tsakiris, Th
  • Cosic, D.
Abstract

<jats:title>Abstract</jats:title><jats:p>The implementation of boron in several fields, such as in the creation of p-type semiconductors in electronics, has created the need for the accurate quantitative determination of its depth profile concentrations in near surface layers of various matrices. In the framework of IBA techniques, a combination of Elastic Backscattering Spectroscopy (EBS), along with Nuclear Reaction Analysis (NRA), has been proposed in order to address the current needs for boron depth profiling, based on the use of a proton beam. Deuterons offer superior mass resolution with respect to protons, having similar stopping power values, but, unfortunately, the lack of experimental datasets concerning the deuteron elastic scattering on boron impedes their use. Thus, in the present work, the first set of measurements for the <jats:sup>11</jats:sup>B(d,d<jats:sub>0</jats:sub>) differential cross sections covering the E<jats:sub>d,lab</jats:sub>=1300-1860 keV energy range for the backscattering angles of 150°, 160° and 170° was carried out. The study was conducted at the 5.5 MV Tandem Accelerator of the Institute of Nuclear and Particle Physics, in the National Center of Scientific Research “Demokritos”, Athens, Greece. The target was a thin, self-supporting aluminum foil, upon which a thin <jats:sup>nat</jats:sup>B (isotopic ratio: <jats:sup>11</jats:sup>B 80.1%, <jats:sup>10</jats:sup>B 19.9%) layer was deposited using the sputtering technique at RBI, Zagreb, Croatia, followed by the evaporation of an ultra-thin layer of <jats:sup>197</jats:sup>Au on top for wear protection and normalization purposes. The outgoing particles were detected using 6 Silicon Surface Barrier (S.S.B.) detectors and the differential cross sections for the elastic scattering were determined from the resulting spectra via the relative measurement technique.</jats:p>

Topics
  • surface
  • aluminium
  • Silicon
  • Boron
  • evaporation
  • spectroscopy
  • p-type semiconductor