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Polo, Alessandro
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article
NDT/NDE by means of a probabilistic differential compressive sensing method
Abstract
<jats:title>Abstract</jats:title><jats:p>A novel microwave imaging (<jats:italic>MI</jats:italic>) method is proposed to deal with the nondestructive testing and evaluation (<jats:italic>NDT/NDE</jats:italic>) of dielectric structures. The proposed technique exploits a <jats:italic>probabilistic differential</jats:italic> contrast source inversion (<jats:italic>D-CSI</jats:italic>) formulation of the inverse scattering (<jats:italic>IS</jats:italic>) problem, which is then effectively solved by means of a customized multi-task Bayesian compressive sensing (<jats:italic>MT-BCS</jats:italic>) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed <jats:italic>NDT/NDE</jats:italic> method, as well as to compare it. with a single-task (<jats:italic>ST-BCS</jats:italic>) implementation within the same framework.</jats:p>