693.932 PEOPLE
| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Dalfonso, Adrian
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (7/7 displayed)
- 2010Elemental mapping in scanning transmission electron microscopycitations
- 2009Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy imagescitations
- 2008Depth sectioning using electron energy loss spectroscopycitations
- 2008Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scatteringcitations
- 2008Volcano structure in atomic resolution core-loss imagescitations
- 2007Interpreting atomic-resolution spectroscopic imagescitations
- 2007Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopycitations
Places of action
| Organizations | Location | People |
|---|
document
Depth sectioning using electron energy loss spectroscopy
Abstract
The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of focus, facilitating optical slicing or depth sectioning of samples. The inclusion of post specimen aberration corrected image forming lenses allows for scanning confocal electron microscopy with further improved depth resolution and selectivity.