Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Vrije Universiteit Brussel

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2019Electro-Absorption Modulator vertically integrated on a VCSEL: microstrip-based high-speed electrical injection on top of a BCB layer4citations
  • 2017Oxide-confined VCSELs fabricated with a simple self-aligned process flow2citations
  • 2017Single lithography-step self-aligned fabrication process for Vertical-Cavity Surface-Emitting Lasers10citations
  • 2017Strain induced polarization chaos in a solitary VCSEL19citations
  • 2016Self-aligned BCB planarization method for high frequency signal injection in a VCSEL with an integrated modulator3citations
  • 2013Polarization Dynamics of VCSELscitations
  • 2012Monitoring of gamma-irradiated Yb-doped optical fibers through pump induce refractive index changes effectcitations
  • 2010Photonic crystal vertical-cavity surface-emitting lasers with true photonic bandgapcitations
  • 2007Optimal radii of photonic crystal holes within DBR mirrors in long wavelength VCSELcitations
  • 2002Polarization Behavior of Vertical-Cavity Surface-Emitting Lasers under the Influence of In-Plane Anisotropic Straincitations

Places of action

Chart of shared publication
Marigo-Lombart, Ludovic
2 / 2 shared
Mazenq, Laurent
2 / 3 shared
Rumeau, Alexandre
1 / 2 shared
Arnoult, Alexandre
3 / 21 shared
Thienpont, Hugo
7 / 83 shared
Ghannam, Ayad
1 / 6 shared
Almuneau, Guilhem
4 / 23 shared
Viallon, Christophe
1 / 5 shared
Lecestre, Aurélie
1 / 9 shared
Calvez, Stéphane
1 / 18 shared
Dubreuil, Pascal
1 / 2 shared
Mauran, Nicolas
1 / 3 shared
Reig, Benjamin
2 / 7 shared
Lombart, Ludovic Marigo
2 / 2 shared
Borges, B. H. V.
1 / 1 shared
Raddo, Thiago
1 / 1 shared
Virte, Martin
1 / 2 shared
Rousset, Bernard
1 / 1 shared
Doucet, Jean-Baptiste
1 / 1 shared
Lecestre, Aurelie
1 / 1 shared
Prati, Franco
1 / 2 shared
Megret, P.
1 / 1 shared
Petukhova, Irina
1 / 1 shared
Fotiadi, A. A.
1 / 1 shared
Antipov, O. L.
1 / 1 shared
Zolotovskiy, I. O.
1 / 1 shared
Borisova, C. V.
1 / 1 shared
Novikov, S. G.
1 / 1 shared
Tomashuk, A. L.
1 / 1 shared
Shubin, A. V.
1 / 2 shared
Dems, M.
2 / 2 shared
Czyszanowski, Tomasz
1 / 3 shared
Veretennicoff, Irina
1 / 4 shared
Albert, Jan
1 / 1 shared
Nagler, Bob
1 / 6 shared
Verschaffelt, Guy
1 / 2 shared
Peeters, Michael
1 / 1 shared
Danckaert, Jan
1 / 4 shared
Chart of publication period
2019
2017
2016
2013
2012
2010
2007
2002

Co-Authors (by relevance)

  • Marigo-Lombart, Ludovic
  • Mazenq, Laurent
  • Rumeau, Alexandre
  • Arnoult, Alexandre
  • Thienpont, Hugo
  • Ghannam, Ayad
  • Almuneau, Guilhem
  • Viallon, Christophe
  • Lecestre, Aurélie
  • Calvez, Stéphane
  • Dubreuil, Pascal
  • Mauran, Nicolas
  • Reig, Benjamin
  • Lombart, Ludovic Marigo
  • Borges, B. H. V.
  • Raddo, Thiago
  • Virte, Martin
  • Rousset, Bernard
  • Doucet, Jean-Baptiste
  • Lecestre, Aurelie
  • Prati, Franco
  • Megret, P.
  • Petukhova, Irina
  • Fotiadi, A. A.
  • Antipov, O. L.
  • Zolotovskiy, I. O.
  • Borisova, C. V.
  • Novikov, S. G.
  • Tomashuk, A. L.
  • Shubin, A. V.
  • Dems, M.
  • Czyszanowski, Tomasz
  • Veretennicoff, Irina
  • Albert, Jan
  • Nagler, Bob
  • Verschaffelt, Guy
  • Peeters, Michael
  • Danckaert, Jan
OrganizationsLocationPeople

article

Oxide-confined VCSELs fabricated with a simple self-aligned process flow

  • Marigo-Lombart, Ludovic
  • Arnoult, Alexandre
  • Thienpont, Hugo
  • Calvez, Stéphane
  • Almuneau, Guilhem
  • Panajotov, Krassimir
Abstract

We propose a simplified and easier fabrication process flow for the manufacturing of AlOx-confined VCSELs based on combining the oxidation step with a self-aligned process, allowing the mesa etching and two successive lift-off steps based on a single lithography step. The electro-optical confinement achieved by standard lateral oxidation enables a low threshold and a single mode behaviour for the VCSEL. This simplified process can largely improve VCSEL manufacturing by reducing the processing time and costs compared to the standard VCSEL process. Introduction: Vertical-cavity surface-emitting lasers (VCSEL) have become the preferred light sources in many photonic systems, enabling short-link interconnections [1] but also in other emerging mass-market applications like sensing and detection [2]. The large production volume of VCSELs would benefit from a simplification of the manufacturing process flow that may largely increase the cost-effectiveness. Indeed, compared to the LED and LDs, the VCSEL fabrication process flow requires a large number of elementary steps defined by successive inter-aligned photolithography levels. A precision in the micron range is required to ensure the lateral alignment between the optical waveguide and the electrical injection. For these reasons, one of the most important concerns for the VCSEL manufacturers is to improve the production throughput by lowering the fabrication time and cost per wafer. The development of a self-aligned process is of great interest as already demonstrated for the fabrication of high performance HBT transistors or ridge lasers [3,4]. To that extent, Al-Omari [5] used a top metallic contact deposited over a photoresist layer as a hard mask to dry-etch the VCSEL mesa. Chua [6] developed a pseudo-planar approach by opening via holes down to the AlAs layer to carry out the lateral oxidation. This process has subsequently been improved by Strzelecka [7] to increase the device density. Recently, we have shown that air-post VCSELs could be created using an innovative self-aligned process, which combined several masking and lift-off steps defined by a single lithographic step [8]. In this paper, we extend this work and propose a new process flow to fabricate, in a very simple and straightforward way, the widely-used oxide-confined VCSELs. The demonstrated process drastically simplifies the oxide-confined VCSEL fabrication by reducing the total number of lithographic alignment steps from four or more to only one alignment, with the additional advantage of relieving the required tolerances. This process flow, most suitable for 3D imaging and sensing applications, can also be easily implemented for the fabrication of other optoelectronic devices such as modulators, ridge waveguide lasers, detectors, solar cells or any process combining dry etch, passivation and metallization.

Topics
  • density
  • impedance spectroscopy
  • surface
  • etching
  • lithography
  • aligned